Jinzhen Liu, Yapeng Zhou, Hui Xiong, Xiaobin Li, Fangming Shi
{"title":"基于欠采样结合快速数字解调算法的多频率电阻抗断层成像系统。","authors":"Jinzhen Liu, Yapeng Zhou, Hui Xiong, Xiaobin Li, Fangming Shi","doi":"10.1063/5.0231415","DOIUrl":null,"url":null,"abstract":"<p><p>Multifrequency electrical impedance tomography (MFEIT) has shown great application prospects in the field of biomedical imaging. To realize high-precision multifrequency electrical impedance information acquisition, a high-precision MFEIT system with undersampling combined with a fast digital demodulation algorithm is proposed. The system is integrated with 16 electrodes, and semi-parallel acquisition is used. In addition, a novel multifrequency digital demodulation algorithm is applied to enhance the accuracy of multifrequency excitation signal demodulation and achieve rapid demodulation. This improvement is achieved by analyzing the process of the multifrequency digital demodulation algorithm and combining undersampling with a fast digital demodulation technique. To evaluate the proposed method, a systematic comparative experiment is conducted. The experimental results demonstrate that the demodulation error using the undersampling method is less than 0.7% within the frequency range of 5-500 kHz. In addition, the system achieves a maximum signal-to-noise ratio of 62.92 dB, an average blur radius of 0.953, and an average position error percentage of 9.3%. The results indicate that the MFEIT system constructed based on the above research has good performance and a high signal-to-noise ratio.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":"95 11","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multifrequency electrical impedance tomography system based on undersampling combined with a fast digital demodulation algorithm.\",\"authors\":\"Jinzhen Liu, Yapeng Zhou, Hui Xiong, Xiaobin Li, Fangming Shi\",\"doi\":\"10.1063/5.0231415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Multifrequency electrical impedance tomography (MFEIT) has shown great application prospects in the field of biomedical imaging. To realize high-precision multifrequency electrical impedance information acquisition, a high-precision MFEIT system with undersampling combined with a fast digital demodulation algorithm is proposed. The system is integrated with 16 electrodes, and semi-parallel acquisition is used. In addition, a novel multifrequency digital demodulation algorithm is applied to enhance the accuracy of multifrequency excitation signal demodulation and achieve rapid demodulation. This improvement is achieved by analyzing the process of the multifrequency digital demodulation algorithm and combining undersampling with a fast digital demodulation technique. To evaluate the proposed method, a systematic comparative experiment is conducted. The experimental results demonstrate that the demodulation error using the undersampling method is less than 0.7% within the frequency range of 5-500 kHz. In addition, the system achieves a maximum signal-to-noise ratio of 62.92 dB, an average blur radius of 0.953, and an average position error percentage of 9.3%. The results indicate that the MFEIT system constructed based on the above research has good performance and a high signal-to-noise ratio.</p>\",\"PeriodicalId\":21111,\"journal\":{\"name\":\"Review of Scientific Instruments\",\"volume\":\"95 11\",\"pages\":\"\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2024-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Review of Scientific Instruments\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0231415\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Review of Scientific Instruments","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1063/5.0231415","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Multifrequency electrical impedance tomography system based on undersampling combined with a fast digital demodulation algorithm.
Multifrequency electrical impedance tomography (MFEIT) has shown great application prospects in the field of biomedical imaging. To realize high-precision multifrequency electrical impedance information acquisition, a high-precision MFEIT system with undersampling combined with a fast digital demodulation algorithm is proposed. The system is integrated with 16 electrodes, and semi-parallel acquisition is used. In addition, a novel multifrequency digital demodulation algorithm is applied to enhance the accuracy of multifrequency excitation signal demodulation and achieve rapid demodulation. This improvement is achieved by analyzing the process of the multifrequency digital demodulation algorithm and combining undersampling with a fast digital demodulation technique. To evaluate the proposed method, a systematic comparative experiment is conducted. The experimental results demonstrate that the demodulation error using the undersampling method is less than 0.7% within the frequency range of 5-500 kHz. In addition, the system achieves a maximum signal-to-noise ratio of 62.92 dB, an average blur radius of 0.953, and an average position error percentage of 9.3%. The results indicate that the MFEIT system constructed based on the above research has good performance and a high signal-to-noise ratio.
期刊介绍:
Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.