用于精确测量折射率和温度的基于偏振维持光纤的矛头形干涉传感器

IF 5.2 2区工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY

Measurement Pub Date : 2024-10-29 DOI:10.1016/j.measurement.2024.116104

Ashish Kumar, Abhishek Joshi, Hyoung Won Baac

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引用次数: 0

摘要

本文描述了一种名为 MBPIS 的矛头形弯曲偏振维持光纤干涉测量传感结构，并对其进行了实验演示，用于精确测量温度和折射率。通过模拟直的和弯曲的 PANDA 光纤中场强的空间分布，解释了传感器的工作原理。通过将 PMF 的弯曲直径从 17 mm 调整到 11 mm，操纵传播光纤模式的双折射，优化了传感器输出光谱中干涉浸渍波长（1527.825 nm）的最大消光比（∼21 dBm）。由于温度和 RI 引起的双折射，这些光纤模式之间的相位差发生了变化，导致干扰光谱发生偏移。对于 1.3333 至 1.3579 的各种分析物，传感器的最高 RI 灵敏度为 -259.32 nm/RIU。相反，在 0 ∼ 100 ℃ 的温度范围内，最高温度灵敏度分别为 -220 pm/℃ 和 -0.139 dBm/℃。

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Polarization-maintaining fiber based macehead shaped interferometric sensor for accurate measurement of refractive index and temperature

A macehead-shaped bent polarization-maintaining fiber-based interferometric sensing structure called MBPIS is described and experimentally demonstrated for precise temperature and refractive index measurement. The sensor’s working principle is explained by simulating the spatial distribution of the field intensity in straight and bending PANDA fibers. A maximum extinction ratio (∼21 dBm) for the interference dip wavelength (1527.825 nm) in the sensor’s output spectrum was optimized by manipulating the birefringence of propagating fiber modes by adjusting PMF’s bending diameter from 17 to 11 mm. The phase difference changes between these fiber modes due to temperature and RI-induced birefringence cause a shift in the interference spectrum. The sensor’s highest RI sensitivity has been seen at −259.32 nm/RIU for a wide range of analytes from 1.3333 to 1.3579. In contrast, the highest temperature sensitivities evaluated for the temperature range of 0 ∼ 100 ℃ are −220 pm/℃ and −0.139 dBm/℃, respectively.

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来源期刊

Measurement 工程技术-工程：综合

CiteScore

10.20

自引率

12.50%

发文量

1589

审稿时长

12.1 months

期刊介绍： Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.