用于降低复杂性和高性能有源电子扫描阵列的近零指数超材料透镜

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
J. Daniel Binion, Colin A. Mussman, Erik Lier, Thomas H. Hand, Douglas H. Werner
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引用次数: 0

摘要

本文介绍了一种由各向异性近零指数超材料(NZIM)组成的透镜,用于改善有源电子扫描阵列(AESA)的远场性能。几项模拟研究证明了如何对 NZIM 透镜(metalens)进行功能化处理,使阵列的嵌入元件图案从典型的余弦形状转变为平顶图案,从而显著降低更宽角度的增益。这相当于在所需视场(FOV)内减少扫描损耗和抑制光栅裂片,特别是对于元素间距较大的阵列(即稀疏或稀疏阵列)。通过几项模拟研究,展示了金属膜的概念,说明了 NZIM 材料的光束整形能力。制造的金属膜完全抑制了光栅裂片,扫描损耗极小,视场角为±10°,非常适合地球同步卫星通信等有限视场角的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

A Near-Zero Index Metamaterial Lens for Reduced Complexity and High-Performance Active Electronically Scanned Arrays

A Near-Zero Index Metamaterial Lens for Reduced Complexity and High-Performance Active Electronically Scanned Arrays
A lens consisting of an anisotropic near-zero index metamaterial (NZIM) is introduced for improving the far-field performance of active electronically scanned arrays (AESA). Several simulation studies demonstrate how the NZIM lens (metalens) can be functionalized to transform the embedded element pattern of an array from a typical cosinusoidal shape to a flat-topped pattern, dramatically reducing the gain at wider angles. This corresponds to reductions in scan loss and suppression of grating lobes in the desired field of view (FOV), especially for arrays with large element spacing (i.e., sparse or thinned arrays). The metalens concept is demonstrated through several simulation studies illustrating the beam shaping capability of NZIM materials. A fabricated metalens demonstrates full suppression of grating lobes and minimal scan loss with a ±10° FOV, which is ideally suited for limited FOV applications such as geosynchronous satellite communications.
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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