通过前驱体与空心电极的后混合馈入,提高常压等离子体喷射沉积绝缘薄膜的稳定性

IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS
Xinglei Cui, Long Li, Zhonglian Li, Runhua Li, Yizhuo Wang, Xi Zhu, Zhi Fang
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引用次数: 0

摘要

使用常压等离子喷射(APPJ)沉积薄膜是提高绝缘材料表面性能的有效方法,因为它具有高反应性和灵活的操作性。然而,等离子体激活的前驱体在通过电极间隙时,不可避免地会在介质管内产生内壁污染,从而在长期运行过程中降低薄膜沉积的稳定性。本文设计了一种后混合前驱体馈入装置,以抑制介质管污染并提高薄膜沉积稳定性。比较了传统的预混合贯穿件和本文提出的后混合贯穿件对放电和薄膜沉积稳定性的影响。通过图像处理技术获得了内壁污染的厚度。诊断随运行时间变化的电气和光学放电特性,以评估放电稳定性。薄膜的性能由水接触角(WCA)和闪蒸电压来表征。最后,通过扫描电子显微镜(SEM)和 X 射线光电子能谱(XPS)测量薄膜的物理化学性质变化,以探索前驱体馈入对薄膜沉积稳定性的影响机制。结果表明,在 30 分钟的操作后,混合后馈入的污染厚度减少了 79.9%。污染增长会增加初始放电电压并降低放电强度,而混合后馈入可显著抑制污染增长。经过 30 分钟的操作后,混合后贯穿件的 WCA 和闪络电压降低了 10%。根据扫描电子显微镜(SEM)和 XPS 的结果,混合后贯穿件的薄膜物理化学特性没有发生明显变化。然而,预混合贯穿件的高氧化硅键比例降低了,交联度也急剧下降。本文为优化前驱体通量以提高使用 APPJ 沉积薄膜的稳定性提供了参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving insulating film deposition stability with atmospheric pressure plasma jet by post-mixing precursor feedthrough with hollow electrode
Film deposition with atmospheric pressure plasma jet (APPJ) is an effective approach to enhance surface performances of insulating materials for its high reactivity and flexible operation. However, the plasma-activated precursor will inevitably produce inner-wall contamination in the dielectric tube as it travels through the electrode gap, deteriorating film deposition stability during long-term operation. In this paper, a post-mixing precursor feedthrough is designed to suppress the dielectric tube contamination and improve film deposition stability. The influences of traditional pre-mixing feedthrough and post-mixing feedthrough proposed in this paper on discharge and film deposition stability are compared. The thickness of inner-wall contamination is acquired by image processing technique. The electrical and optical discharge characteristic variations with operation duration are diagnosed to evaluate the discharge stability. The film performance is characterized by the water contact angle (WCA) and flashover voltage. Finally, scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS) measurements are performed for the film physicochemical property variations to explore the mechanism about the effect of precursor feedthrough on film deposition stability. The results indicate that the thickness of the contamination is reduced by 79.9 % for the post-mixing feedthrough after a 30-minute operation. Contamination growth increases the initial discharge voltage and decreases the discharge strength, which is remarkably inhibited for the post-mixing feedthrough. The degradation of WCA and flashover voltage for the post-mixing feedthrough is <10 % after a 30-minute operation. The film physicochemical properties for the post-mixing feedthrough exhibit no spectacular change according to SEM and XPS results. Whereas, the ratio of high-oxidized silicone bonds for the pre-mixing feedthrough is reduced and the degree of cross-linking is drastically decreased. This paper provides a reference for optimizing precursor feedthrough to improve the stability of film deposition with APPJ.
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来源期刊
Thin Solid Films
Thin Solid Films 工程技术-材料科学:膜
CiteScore
4.00
自引率
4.80%
发文量
381
审稿时长
7.5 months
期刊介绍: Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.
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