改进用于不透明度光谱诊断的 Agfa X 射线胶片的特性。

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
A E Peterson, E C Dutra, C S Conlon, T Cunningham, R F Heeter, J Knauer, R A Knight, K J Moy, G Torres, M S Wallace, T S Perry
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引用次数: 0

摘要

国家点火装置在高能量密度实验中使用软 X 射线不透明度光谱仪进行 X 射线光谱成像。对更高光谱分辨率的需求不断增加,促使我们对爱克发 D4 薄膜进行了研究。该薄膜的特性分析工作已经开始。使用曼森 X 射线源,使用六个不同的阳极,将胶片曝光到线性光学密度 (OD) 区域。这是先前工作的延续,现将更新后的分析过程在此通报。更新后的步骤减少了确定的不确定性,改善了表征过程的结果。当斯坦福同步辐射光源 16-2 光束线投入使用时,薄膜的表征工作就在该光源进行。该光源的光束具有更高的通量,达到饱和所需的曝光时间更短。本文对两种光源的结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improvements to the characterization of Agfa x-ray film for use on opacity spectroscopy diagnostics.

The National Ignition Facility uses a soft x-ray opacity spectrometer for x-ray spectral imaging in high-energy-density experiments. The increased demand for a better spectral resolution prompted the investigation into the Agfa D4 film. Characterization is already under way for the film. A Manson x-ray source using six different anodes was used to expose film to the linear optical density (OD) region. This is a continuation of the previous work, and the updated analysis process is communicated here. The identified uncertainties have been reduced with the updated steps that improve the results of the characterization process. When the Stanford Synchrotron Radiation Lightsource Beamline 16-2 was operational, the film was characterized at that source. Its beam offered a higher fluency with a lower exposure time needed to reach saturation. Results for both sources are compared in this paper.

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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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