Yizhou Mao, Shubin Zheng, Liming Li, Renjie Shi, Xiaoxue An
{"title":"基于改进型中心网的轨道表面缺陷检测研究","authors":"Yizhou Mao, Shubin Zheng, Liming Li, Renjie Shi, Xiaoxue An","doi":"10.3390/electronics13173580","DOIUrl":null,"url":null,"abstract":"Rail surface defect detection is vital for railway safety. Traditional methods falter with varying defect sizes and complex backgrounds, while two-stage deep learning models, though accurate, lack real-time capabilities. To overcome these challenges, we propose an enhanced one-stage detection model based on CenterNet. We replace ResNet with ResNeXt and implement a multi-branch structure for better low-level feature extraction. Additionally, we integrate SKNet attention mechanism with the C2f structure from YOLOv8, improving the model’s focus on critical image regions and enhancing the detection of minor defects. We also introduce an elliptical Gaussian kernel for size regression loss, better representing the aspect ratio of rail defects. This approach enhances detection accuracy and speeds up training. Our model achieves a mean accuracy (mAP) of 0.952 on the rail defects dataset, outperforming other models with a 6.6% improvement over the original and a 35.5% increase in training speed. These results demonstrate the efficiency and reliability of our method for rail defect detection.","PeriodicalId":11646,"journal":{"name":"Electronics","volume":null,"pages":null},"PeriodicalIF":2.6000,"publicationDate":"2024-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research on Rail Surface Defect Detection Based on Improved CenterNet\",\"authors\":\"Yizhou Mao, Shubin Zheng, Liming Li, Renjie Shi, Xiaoxue An\",\"doi\":\"10.3390/electronics13173580\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Rail surface defect detection is vital for railway safety. Traditional methods falter with varying defect sizes and complex backgrounds, while two-stage deep learning models, though accurate, lack real-time capabilities. To overcome these challenges, we propose an enhanced one-stage detection model based on CenterNet. We replace ResNet with ResNeXt and implement a multi-branch structure for better low-level feature extraction. Additionally, we integrate SKNet attention mechanism with the C2f structure from YOLOv8, improving the model’s focus on critical image regions and enhancing the detection of minor defects. We also introduce an elliptical Gaussian kernel for size regression loss, better representing the aspect ratio of rail defects. This approach enhances detection accuracy and speeds up training. Our model achieves a mean accuracy (mAP) of 0.952 on the rail defects dataset, outperforming other models with a 6.6% improvement over the original and a 35.5% increase in training speed. These results demonstrate the efficiency and reliability of our method for rail defect detection.\",\"PeriodicalId\":11646,\"journal\":{\"name\":\"Electronics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.6000,\"publicationDate\":\"2024-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.3390/electronics13173580\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, INFORMATION SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3390/electronics13173580","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
Research on Rail Surface Defect Detection Based on Improved CenterNet
Rail surface defect detection is vital for railway safety. Traditional methods falter with varying defect sizes and complex backgrounds, while two-stage deep learning models, though accurate, lack real-time capabilities. To overcome these challenges, we propose an enhanced one-stage detection model based on CenterNet. We replace ResNet with ResNeXt and implement a multi-branch structure for better low-level feature extraction. Additionally, we integrate SKNet attention mechanism with the C2f structure from YOLOv8, improving the model’s focus on critical image regions and enhancing the detection of minor defects. We also introduce an elliptical Gaussian kernel for size regression loss, better representing the aspect ratio of rail defects. This approach enhances detection accuracy and speeds up training. Our model achieves a mean accuracy (mAP) of 0.952 on the rail defects dataset, outperforming other models with a 6.6% improvement over the original and a 35.5% increase in training speed. These results demonstrate the efficiency and reliability of our method for rail defect detection.
ElectronicsComputer Science-Computer Networks and Communications
CiteScore
1.10
自引率
10.30%
发文量
3515
审稿时长
16.71 days
期刊介绍:
Electronics (ISSN 2079-9292; CODEN: ELECGJ) is an international, open access journal on the science of electronics and its applications published quarterly online by MDPI.