Mohammad Eslami;Tara Ghasempouri;Samuel Pagliarini
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SCARF: Securing Chips With a Robust Framework Against Fabrication-Time Hardware Trojans
The globalization of the semiconductor industry has introduced security challenges to Integrated Circuits (ICs), particularly those related to the threat of Hardware Trojans (HTs) – malicious logic that can be introduced during IC fabrication. While significant efforts are directed towards verifying the correctness and reliability of ICs, their security is often overlooked. In this paper, we propose a comprehensive framework that integrates a suite of methodologies for both front-end and back-end stages of design, aimed at enhancing the security of ICs. Initially, we outline a systematic methodology to transform existing verification assets into potent security checkers by repurposing verification assertions. To further improve security, we introduce an innovative methodology for integrating online monitors during physical synthesis – a back-end insertion providing an additional layer of defense. Experimental results demonstrate a significant increase in security, measured by our introduced metric, Security Coverage (SC), with a marginal rise in area and power consumption, typically under 20%. The insertion of online monitors during physical synthesis enhances security metrics by up to 33.5%. This holistic framework offers a comprehensive defense mechanism across the entire spectrum of IC design.
期刊介绍:
The IEEE Transactions on Computers is a monthly publication with a wide distribution to researchers, developers, technical managers, and educators in the computer field. It publishes papers on research in areas of current interest to the readers. These areas include, but are not limited to, the following: a) computer organizations and architectures; b) operating systems, software systems, and communication protocols; c) real-time systems and embedded systems; d) digital devices, computer components, and interconnection networks; e) specification, design, prototyping, and testing methods and tools; f) performance, fault tolerance, reliability, security, and testability; g) case studies and experimental and theoretical evaluations; and h) new and important applications and trends.