{"title":"用特征向量维度缩减法预测带有不确定性传播的热机械焊料疲劳失效的耐久性分布","authors":"Chien-Ming Huang , Jeffrey W. Herrmann","doi":"10.1016/j.microrel.2024.115453","DOIUrl":null,"url":null,"abstract":"<div><p>Current fatigue models for predicting the cycles to failure (fatigue life) of solder joints under thermo-mechanical loadings can only provide point estimates of the characteristic life or median life. Nevertheless, the prediction of fatigue life should be distributed with the uncertainties. Unfortunately, previous work has not discussed the uncertainty of the cycles to failure, especially for the solder joints under temperature cycling. Therefore, the uncertainty propagation of the cycles to failure is necessary to better estimate the distribution of the fatigue life of solder joint. This paper presents a four-part uncertainty propagation approach for this problem. Part I models the solder joint using finite element analysis. Part II uses the eigenvector dimension reduction method and finite element analysis simulation tool to determine the distribution of the system response, which is the strain energy density accumulation. Part III uses a fatigue model to convert the distribution of strain energy density accumulation into a distribution of characteristic life (in cycles) by choosing the appropriate fatigue model. Part IV determines the cumulative distribution functions of the fatigue life of solder joint. We applied this method to a specific example of a solder joint for a ball grid array component to illustrate the procedure. This paper contributes to the field of durability prediction by proposing a novel uncertainty propagation method to estimate the uncertainty in the fatigue life of solder joints. Using this method can help engineers make solder material selection decisions and understand the factors that contribute most to solder joint fatigue life uncertainty.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"161 ","pages":"Article 115453"},"PeriodicalIF":1.6000,"publicationDate":"2024-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Durability distribution prediction of thermo-mechanical solder fatigue failure with uncertainty propagation by eigenvector dimension reduction method\",\"authors\":\"Chien-Ming Huang , Jeffrey W. Herrmann\",\"doi\":\"10.1016/j.microrel.2024.115453\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Current fatigue models for predicting the cycles to failure (fatigue life) of solder joints under thermo-mechanical loadings can only provide point estimates of the characteristic life or median life. Nevertheless, the prediction of fatigue life should be distributed with the uncertainties. Unfortunately, previous work has not discussed the uncertainty of the cycles to failure, especially for the solder joints under temperature cycling. Therefore, the uncertainty propagation of the cycles to failure is necessary to better estimate the distribution of the fatigue life of solder joint. This paper presents a four-part uncertainty propagation approach for this problem. Part I models the solder joint using finite element analysis. Part II uses the eigenvector dimension reduction method and finite element analysis simulation tool to determine the distribution of the system response, which is the strain energy density accumulation. Part III uses a fatigue model to convert the distribution of strain energy density accumulation into a distribution of characteristic life (in cycles) by choosing the appropriate fatigue model. Part IV determines the cumulative distribution functions of the fatigue life of solder joint. We applied this method to a specific example of a solder joint for a ball grid array component to illustrate the procedure. This paper contributes to the field of durability prediction by proposing a novel uncertainty propagation method to estimate the uncertainty in the fatigue life of solder joints. Using this method can help engineers make solder material selection decisions and understand the factors that contribute most to solder joint fatigue life uncertainty.</p></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"161 \",\"pages\":\"Article 115453\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-08-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271424001331\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001331","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Durability distribution prediction of thermo-mechanical solder fatigue failure with uncertainty propagation by eigenvector dimension reduction method
Current fatigue models for predicting the cycles to failure (fatigue life) of solder joints under thermo-mechanical loadings can only provide point estimates of the characteristic life or median life. Nevertheless, the prediction of fatigue life should be distributed with the uncertainties. Unfortunately, previous work has not discussed the uncertainty of the cycles to failure, especially for the solder joints under temperature cycling. Therefore, the uncertainty propagation of the cycles to failure is necessary to better estimate the distribution of the fatigue life of solder joint. This paper presents a four-part uncertainty propagation approach for this problem. Part I models the solder joint using finite element analysis. Part II uses the eigenvector dimension reduction method and finite element analysis simulation tool to determine the distribution of the system response, which is the strain energy density accumulation. Part III uses a fatigue model to convert the distribution of strain energy density accumulation into a distribution of characteristic life (in cycles) by choosing the appropriate fatigue model. Part IV determines the cumulative distribution functions of the fatigue life of solder joint. We applied this method to a specific example of a solder joint for a ball grid array component to illustrate the procedure. This paper contributes to the field of durability prediction by proposing a novel uncertainty propagation method to estimate the uncertainty in the fatigue life of solder joints. Using this method can help engineers make solder material selection decisions and understand the factors that contribute most to solder joint fatigue life uncertainty.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.