{"title":"比较二维纠错码的结构","authors":"Adahil Muniz , Lucas Mazzoco , Wagner Savaris , Eduarda Pissolatto , Tiago Beneditto , Andrew Fritsch , Jarbas Silveira , César Marcon","doi":"10.1016/j.microrel.2024.115481","DOIUrl":null,"url":null,"abstract":"<div><p>Advances in integrated circuit production technologies have reduced device sizes, leading to corresponding scaling in electrical characteristics, such as threshold voltage. This scaling has increased the susceptibility of devices to electromagnetic radiation, raising the bitflip probability. Systems requiring a certain level of fault tolerance employ techniques like Error Correction Codes (ECC), providing a degree of reliability in mitigating this issue. The error correction and detection efficacies and ECC scalability vary based on the encoding and codestruct employed. This study employs four Hamming and parity code organizations for performing four Two-Dimensional (2D)-ECCs (N × 4p, N × ExHam, N × Ham_p, and N × Ham2_2p). We investigated the scalability, synthesis results, and correction and detection rates employing the same number of check and data bits for the four 2D-ECCs. The results point to the advantages for ECCs that employ cross-checking using radiation-hardened memories for checkbits, especially when ECCs scale to large codestructs.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"161 ","pages":"Article 115481"},"PeriodicalIF":1.6000,"publicationDate":"2024-08-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparing structures of two-dimensional error correction codes\",\"authors\":\"Adahil Muniz , Lucas Mazzoco , Wagner Savaris , Eduarda Pissolatto , Tiago Beneditto , Andrew Fritsch , Jarbas Silveira , César Marcon\",\"doi\":\"10.1016/j.microrel.2024.115481\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Advances in integrated circuit production technologies have reduced device sizes, leading to corresponding scaling in electrical characteristics, such as threshold voltage. This scaling has increased the susceptibility of devices to electromagnetic radiation, raising the bitflip probability. Systems requiring a certain level of fault tolerance employ techniques like Error Correction Codes (ECC), providing a degree of reliability in mitigating this issue. The error correction and detection efficacies and ECC scalability vary based on the encoding and codestruct employed. This study employs four Hamming and parity code organizations for performing four Two-Dimensional (2D)-ECCs (N × 4p, N × ExHam, N × Ham_p, and N × Ham2_2p). We investigated the scalability, synthesis results, and correction and detection rates employing the same number of check and data bits for the four 2D-ECCs. The results point to the advantages for ECCs that employ cross-checking using radiation-hardened memories for checkbits, especially when ECCs scale to large codestructs.</p></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"161 \",\"pages\":\"Article 115481\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-08-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271424001616\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001616","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Comparing structures of two-dimensional error correction codes
Advances in integrated circuit production technologies have reduced device sizes, leading to corresponding scaling in electrical characteristics, such as threshold voltage. This scaling has increased the susceptibility of devices to electromagnetic radiation, raising the bitflip probability. Systems requiring a certain level of fault tolerance employ techniques like Error Correction Codes (ECC), providing a degree of reliability in mitigating this issue. The error correction and detection efficacies and ECC scalability vary based on the encoding and codestruct employed. This study employs four Hamming and parity code organizations for performing four Two-Dimensional (2D)-ECCs (N × 4p, N × ExHam, N × Ham_p, and N × Ham2_2p). We investigated the scalability, synthesis results, and correction and detection rates employing the same number of check and data bits for the four 2D-ECCs. The results point to the advantages for ECCs that employ cross-checking using radiation-hardened memories for checkbits, especially when ECCs scale to large codestructs.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.