Pb/Nb2O5 界面的高宽带光吸收和带阻滤波器特性

IF 1.5 4区 材料科学 Q3 Chemistry
Sabah. E. Algarni, Atef F. Qasrawi, Najla. M. Khusayfan
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引用次数: 0

摘要

在这项研究中,半透明铅膜作为沉积五氧化二铌薄膜的基底,形成了多功能电子光学器件。利用真空蒸发和离子溅射技术,在≈10-5 毫巴的条件下产生了结晶铅和无定形氧化铌的叠层。这一过程减少了 Nb2O5 中自由载流子的吸收,并形成了宽度为 0.91 eV 的 Urbach 尾态。Pb/Nb2O5 薄膜表现出显著的宽带吸收,在可见光下超过 440%,在红外线下超过 98%。此外,铅基底还导致 Nb2O5 的能带隙发生重移。利用阻抗光谱对 Pb/Nb2O5/Ag 结构进行的电学分析表明了它们的串联/并联共振和带阻滤波器特性。值得注意的是,带阻滤波器在 1.66 GHz 的陷波频率处显示出反射系数最小值,带宽为 280 MHz,回波损耗为 26 dB,电压驻波比为 1.13。这些发现凸显了该器件在整个电磁频谱中广泛的电子光学应用潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

High Broadband Optical Absorption and Bandstop Filter Characteristics of Pb/Nb2O5 Interfaces

High Broadband Optical Absorption and Bandstop Filter Characteristics of Pb/Nb2O5 Interfaces

In this study, semitransparent lead films serve as substrates for depositing niobium pentoxide thin films, forming versatile electro-optical devices. Using vacuum evaporation and ion sputtering techniques at ≈10−5 mbar, stacked layers of crystalline Pb and amorphous Nb2O5 are created. This process reduces free carrier absorption in Nb2O5 and forms Urbach tail states with a width of 0.91 eV. Pb/Nb2O5 thin films exhibit remarkable broadband absorption, exceeding 440% in the visible and 98% in the infrared. Moreover, Pb substrates induce a redshift in Nb2O5’s energy bandgap. Electrical analysis using impedance spectroscopy on Pb/Nb2O5/Ag structures reveals their series/parallel resonance and bandstop filter properties. Notably, the bandstop filters exhibit reflection coefficient minima at a notch frequency of 1.66 GHz, with a bandwidth of 280 MHz, return loss of 26 dB, and voltage standing wave ratio of 1.13. These findings underscore the device's potential for wide-ranging electro-optical applications across the electromagnetic spectrum.

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来源期刊
CiteScore
2.50
自引率
6.70%
发文量
121
审稿时长
1.9 months
期刊介绍: The journal Crystal Research and Technology is a pure online Journal (since 2012). Crystal Research and Technology is an international journal examining all aspects of research within experimental, industrial, and theoretical crystallography. The journal covers the relevant aspects of -crystal growth techniques and phenomena (including bulk growth, thin films) -modern crystalline materials (e.g. smart materials, nanocrystals, quasicrystals, liquid crystals) -industrial crystallisation -application of crystals in materials science, electronics, data storage, and optics -experimental, simulation and theoretical studies of the structural properties of crystals -crystallographic computing
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