Tse-Chuan Hsu, Yao-Hong Tsai, William Cheng-Chung Chu
{"title":"通过具有鲁棒性和容错性的迁移学习,增强边缘计算中发光图像的数字识别能力","authors":"Tse-Chuan Hsu, Yao-Hong Tsai, William Cheng-Chung Chu","doi":"10.1109/tr.2024.3393424","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"79 1","pages":""},"PeriodicalIF":5.0000,"publicationDate":"2024-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhancing Digit Recognition for Luminous Images in Edge Computing Through Transfer Learning With Robustness and Fault Tolerance\",\"authors\":\"Tse-Chuan Hsu, Yao-Hong Tsai, William Cheng-Chung Chu\",\"doi\":\"10.1109/tr.2024.3393424\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":56305,\"journal\":{\"name\":\"IEEE Transactions on Reliability\",\"volume\":\"79 1\",\"pages\":\"\"},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2024-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Reliability\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/tr.2024.3393424\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/tr.2024.3393424","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.