{"title":"三维流道瞬态热扩散阻力的分析解决方案","authors":"Belal Al-Khamaiseh;Yuri S. Muzychka","doi":"10.1109/TCPMT.2024.3412794","DOIUrl":null,"url":null,"abstract":"In microelectronic devices, the moment a high-power current is transmitted into the system, heat is simultaneously generated, and the thermal field keeps developing until it reaches a steady-state field after a period of time. In this work, transient analytical solutions for the temperature field and thermal resistance of a rectangular 3-D flux channel are obtained. The flux channel is assumed to have a small heat source on the top surface, whereas convective effects are considered on the bottom surface and lateral edges. The time-dependent solutions are presented explicitly as infinite Fourier series forms. In addition, the solutions are also presented in dimensionless forms as generalized solutions. Moreover, an existing, well-established simple model that represents the profile of the transient thermal spreading resistance for a semi-infinite flux tube is used to verify the presented forms of the analytical solutions, and the results compare very well when considering a flux channel of large thickness. Further, the solutions are used to study the behavior of temperature and thermal resistance over time for some dimensional and nondimensional problems.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"14 9","pages":"1610-1619"},"PeriodicalIF":2.3000,"publicationDate":"2024-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analytical Solutions for Transient Thermal Spreading Resistance of a 3-D Flux Channel\",\"authors\":\"Belal Al-Khamaiseh;Yuri S. Muzychka\",\"doi\":\"10.1109/TCPMT.2024.3412794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In microelectronic devices, the moment a high-power current is transmitted into the system, heat is simultaneously generated, and the thermal field keeps developing until it reaches a steady-state field after a period of time. In this work, transient analytical solutions for the temperature field and thermal resistance of a rectangular 3-D flux channel are obtained. The flux channel is assumed to have a small heat source on the top surface, whereas convective effects are considered on the bottom surface and lateral edges. The time-dependent solutions are presented explicitly as infinite Fourier series forms. In addition, the solutions are also presented in dimensionless forms as generalized solutions. Moreover, an existing, well-established simple model that represents the profile of the transient thermal spreading resistance for a semi-infinite flux tube is used to verify the presented forms of the analytical solutions, and the results compare very well when considering a flux channel of large thickness. Further, the solutions are used to study the behavior of temperature and thermal resistance over time for some dimensional and nondimensional problems.\",\"PeriodicalId\":13085,\"journal\":{\"name\":\"IEEE Transactions on Components, Packaging and Manufacturing Technology\",\"volume\":\"14 9\",\"pages\":\"1610-1619\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2024-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Components, Packaging and Manufacturing Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10553637/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Components, Packaging and Manufacturing Technology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10553637/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Analytical Solutions for Transient Thermal Spreading Resistance of a 3-D Flux Channel
In microelectronic devices, the moment a high-power current is transmitted into the system, heat is simultaneously generated, and the thermal field keeps developing until it reaches a steady-state field after a period of time. In this work, transient analytical solutions for the temperature field and thermal resistance of a rectangular 3-D flux channel are obtained. The flux channel is assumed to have a small heat source on the top surface, whereas convective effects are considered on the bottom surface and lateral edges. The time-dependent solutions are presented explicitly as infinite Fourier series forms. In addition, the solutions are also presented in dimensionless forms as generalized solutions. Moreover, an existing, well-established simple model that represents the profile of the transient thermal spreading resistance for a semi-infinite flux tube is used to verify the presented forms of the analytical solutions, and the results compare very well when considering a flux channel of large thickness. Further, the solutions are used to study the behavior of temperature and thermal resistance over time for some dimensional and nondimensional problems.
期刊介绍:
IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.