{"title":"探索高效安全访问 IJTAG 网络的非 TAP 接口","authors":"Anjum Riaz;Gaurav Kumar;Lavi Tyagi;Yamuna Prasad;Satyadev Ahlawat","doi":"10.1109/TDMR.2024.3440059","DOIUrl":null,"url":null,"abstract":"The IEEE Std. 1687 (IJTAG) enables efficient access to on-chip instruments through the Test Access Port (TAP) controller of IEEE Std. 1149.1 (JTAG). However, practical constraints such as physical size, manufacturing intricacies, and cost considerations often pose challenges in allocating test IO pins exclusively for TAP usage, especially in resource constraint ICs. To circumvent these limitations, the IEEE Std. P1687.1 explores alternative means of utilizing functional ports, such as Inter-integrated Circuit (I2C), Universal Asynchronous Receiver-Transmitter (UART), and Serial Peripheral Interface (SPI), as non-TAP device interfaces. Recently, a protocol that utilizes UART as a device interface to access on-chip instruments has been proposed. However, this protocol suffers from excessive access time and data overhead and lacks security considerations. To address these issues, this paper presents a low-cost, secure access protocol. The proposed protocol is able to reduce the access time and data overhead by a maximum of 45.51% and 69.66%, respectively, and it incurs a minimal area overhead. Additionally, the protocol integrates robust security measures based on data encryption, thwarting both local and remote intruders from stealing useful information over the IJTAG network.","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 1","pages":"76-84"},"PeriodicalIF":2.5000,"publicationDate":"2024-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network\",\"authors\":\"Anjum Riaz;Gaurav Kumar;Lavi Tyagi;Yamuna Prasad;Satyadev Ahlawat\",\"doi\":\"10.1109/TDMR.2024.3440059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The IEEE Std. 1687 (IJTAG) enables efficient access to on-chip instruments through the Test Access Port (TAP) controller of IEEE Std. 1149.1 (JTAG). However, practical constraints such as physical size, manufacturing intricacies, and cost considerations often pose challenges in allocating test IO pins exclusively for TAP usage, especially in resource constraint ICs. To circumvent these limitations, the IEEE Std. P1687.1 explores alternative means of utilizing functional ports, such as Inter-integrated Circuit (I2C), Universal Asynchronous Receiver-Transmitter (UART), and Serial Peripheral Interface (SPI), as non-TAP device interfaces. Recently, a protocol that utilizes UART as a device interface to access on-chip instruments has been proposed. However, this protocol suffers from excessive access time and data overhead and lacks security considerations. To address these issues, this paper presents a low-cost, secure access protocol. The proposed protocol is able to reduce the access time and data overhead by a maximum of 45.51% and 69.66%, respectively, and it incurs a minimal area overhead. Additionally, the protocol integrates robust security measures based on data encryption, thwarting both local and remote intruders from stealing useful information over the IJTAG network.\",\"PeriodicalId\":448,\"journal\":{\"name\":\"IEEE Transactions on Device and Materials Reliability\",\"volume\":\"25 1\",\"pages\":\"76-84\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2024-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Device and Materials Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10628114/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Device and Materials Reliability","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10628114/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network
The IEEE Std. 1687 (IJTAG) enables efficient access to on-chip instruments through the Test Access Port (TAP) controller of IEEE Std. 1149.1 (JTAG). However, practical constraints such as physical size, manufacturing intricacies, and cost considerations often pose challenges in allocating test IO pins exclusively for TAP usage, especially in resource constraint ICs. To circumvent these limitations, the IEEE Std. P1687.1 explores alternative means of utilizing functional ports, such as Inter-integrated Circuit (I2C), Universal Asynchronous Receiver-Transmitter (UART), and Serial Peripheral Interface (SPI), as non-TAP device interfaces. Recently, a protocol that utilizes UART as a device interface to access on-chip instruments has been proposed. However, this protocol suffers from excessive access time and data overhead and lacks security considerations. To address these issues, this paper presents a low-cost, secure access protocol. The proposed protocol is able to reduce the access time and data overhead by a maximum of 45.51% and 69.66%, respectively, and it incurs a minimal area overhead. Additionally, the protocol integrates robust security measures based on data encryption, thwarting both local and remote intruders from stealing useful information over the IJTAG network.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.