采用自愈技术的容错乘法器

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Raghavendra Kumar Sakali , Noor Mahammad Sk
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引用次数: 0

摘要

现场可编程门阵列(FPGA)是一种多功能设备,能够根据需要重新配置电路逻辑。由于其适应性强,FPGA 被广泛用于开发空间应用、国防和航空领域的关键系统。为了促进这些系统的运行,通常需要使用乘法器电路。由于关键任务系统工作在辐射环境中,而辐射会影响电子设备,因此 FPGA 很容易受到辐射影响,从而破坏所配置电路的功能。为此,乘法器需要一个强大的容错机制。基于可进化硬件的解决方案有望缓解故障,但在可扩展性和错误恢复时间方面仍存在挑战。为了应对这些挑战,我们引入了一种新方法:配备配置比特流发生器(CBG)的自修复乘法器。这项创新通过使用优化的虚拟可重构电路(VRC)乘法器设计,有效缓解了可扩展性问题。此外,通过集成 CBG,所提出的解决方案还能显著缩短错误恢复时间。我们在这项工作中主要关注实现高效性能的内在方法。就 8 × 8 乘法器而言,所提出的工作减少了 64.59% 的 LUT 利用率,并利用内在方法在 29.25 ns 内恢复了错误。与此同时,我们还采用了一种混合方法,提供了与固有方法的比较分析,证明了其性能。我们在 A3PE3000 FPGA 平台上实现了建议的方法,并与建议的混合方法和现有方法进行了比较分析。结果验证了我们使用固有方法所做工作的卓越性能和效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fault-tolerant multiplier using self-healing technique

A Field Programmable Gate Array (FPGA) is a versatile device capable of reconfiguring the logic of circuits as required. FPGAs are widely utilized in developing critical systems for space applications, defence, and aviation due to their adaptability. To facilitate the operation of these systems, a multiplier circuit is often necessary. As mission-critical systems work in a radiation environment, which affects electronic devices, the FPGA is susceptible to radiation effects that may disrupt the functionality of the configured circuit. To address this, the multiplier needs a robust fault-tolerance mechanism. Evolvable-based hardware solutions hold promise for mitigating faults, but challenges related to scalability and error recovery time persist. To address these challenges, we introduce a novel approach: a self-healing multiplier equipped with a configuration bitstream generator (CBG). This innovation effectively mitigates scalability concerns through the use of an optimized Virtual Reconfigurable Circuit (VRC) multiplier design. Additionally, the proposed solution significantly improves error recovery time through CBG integration. Our primary focus in this work is on the intrinsic approach to achieving efficient performance. In the case of the 8 × 8 multiplier, the proposed work reduces 64.59% of LUT utilization and recovers the error in 29.25 ns using an intrinsic approach. In parallel, we employ a hybrid approach to provide a comparative analysis against the intrinsic approach, demonstrating its performance. We implemented the proposed methodology on the A3PE3000 FPGA platform and conducted a comparative analysis against the proposed hybrid approach and existing methods. The results validate the superior performance and efficiency of our work using the intrinsic approach.

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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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