基于制造历史的 PCBA 热循环跨尺度有限元分析,用于更准确地预测焊点的疲劳寿命

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Ruiqian Zheng, Wenqian Li, Mengxuan Cheng, Hao Zheng, Zhiyan Zhao, Guoshun Wan, Yuxi Jia
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引用次数: 0

摘要

印刷电路板组件(PCBA)是集成电路产品的关键部件。为了解决热循环条件下 PCBA 焊点失效的问题,本研究提出了一种多尺度建模方法,以评估 PCBA 工作过程中印刷电路板(PCB)的翘曲和焊点的热疲劳寿命。首先,建立了一个包含印刷电路板、基板、芯片、环氧模塑料(EMC)和焊点的 PCBA 模型。使用介观有限元方法计算 PCB 中导电层 (CDL) 的等效热机械特性,以捕捉其复杂的结构特征。对 PCBA 的回流焊接和热循环过程进行了有限元分析,以系统地研究热循环过程中的温度变化和制造过程中的残余应力对焊点疲劳寿命的影响。结果表明,在热循环过程中,PCB 和基板的不一致变形以及焊点累积的非弹性应变导致焊点的复杂变形,从而导致焊点失效,且危险焊点集中在焊点阵列的边缘。温度范围对焊点的疲劳寿命有很大影响,因为焊点的热疲劳寿命随着温度范围的增加而降低。制造过程中残余应力的存在降低了焊点的疲劳寿命,因此强调了优化回流焊工艺设计以减少焊点残余应力的必要性。本研究开发的跨尺度模拟方法能更准确地预测焊点的热疲劳寿命,从而促进集成电路产品的可靠性研究和优化设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cross-scale finite element analysis of PCBA thermal cycling based on manufacturing history for more accurate fatigue life prediction of solder joints

Printed Circuit Board Assemblies (PCBA) are crucial components of integrated circuit products. To address the issue of solder joint failure in PCBA under thermal cycling conditions, this study proposes a multiscale modeling approach to assess the warpage of the Printed Circuit Board (PCB) and the thermal fatigue life of solder joints during the PCBA working process. Firstly, a PCBA model incorporating the PCB, substrate, chip, Epoxy Molding Compound (EMC), and solder joints was established. The equivalent thermal-mechanical properties of the Conductive Layers (CDLs) in the PCB are calculated using a mesoscopic finite element approach to capture its complex structural characteristics. Finite Element Analysis (FEA) was conducted on the reflow soldering and thermal cycling processes of the PCBA to systematically investigate the effects of temperature variations during thermal cycling and residual stress from the manufacturing process on the fatigue life of solder joints. The results indicate that during the thermal cycling process, the complex deformation of the solder joints caused by the inconsistent deformation of the PCB and substrate as well as the accumulated inelastic strain of the solder joints lead to solder joint failures, and the dangerous solder joint is concentrated at the edges of the solder joint array. The temperature range significantly influenced the fatigue life of solder joints because of the thermal fatigue life of the solder joints decreased as the temperature range increased. The presence of residual stress during manufacturing reduces the fatigue life of solder joints, thus emphasizing the need to optimize the reflow process design to reduce residual stress in solder joints. The cross-scale simulation method developed in this study enables more accurate prediction of the thermal fatigue life of solder joints, thereby facilitating reliability studies and optimized designs of integrated circuit products.

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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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