电气连接器的健康状况

Machines Pub Date : 2024-07-14 DOI:10.3390/machines12070474
Jian Song, Abhay Shukla, Roman Probst
{"title":"电气连接器的健康状况","authors":"Jian Song, Abhay Shukla, Roman Probst","doi":"10.3390/machines12070474","DOIUrl":null,"url":null,"abstract":"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations.","PeriodicalId":509264,"journal":{"name":"Machines","volume":"51 42","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The State of Health of Electrical Connectors\",\"authors\":\"Jian Song, Abhay Shukla, Roman Probst\",\"doi\":\"10.3390/machines12070474\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations.\",\"PeriodicalId\":509264,\"journal\":{\"name\":\"Machines\",\"volume\":\"51 42\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Machines\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3390/machines12070474\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Machines","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/machines12070474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

对于现代机器、工厂、电动汽车和自动驾驶汽车而言,可靠的电气连接器的重要性怎么强调都不为过。随着越来越多的连接器被用于机器、工厂和车辆中,确保其可靠性对于舒适性和安全性都至关重要。可靠性的关键指标之一是连接器的使用寿命。为了评估电气连接器的使用寿命,我们开发了一种测试方法和一个模型,用于根据测试数据计算连接器的使用寿命。这些测试结果与长期现场运行的故障分析数据进行了比较。结果表明,实验室测试能够准确再现现场观察到的主要故障。然而,这种寿命测试需要耗费大量的时间和人力。为了应对这一挑战,我们提出了一种数据驱动方法,通过对短期测试中收集到的电接触电阻数据进行统计分析,预测电连接器的使用寿命。该方法的预测结果与长期测试的实际结果进行了比较。结果表明,短期测试中的接触电阻发展与后期测试中的故障数量之间存在很强的相关性。因此,除了预测连接器的使用寿命外,这种方法还可用于实时操作中的故障预报。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The State of Health of Electrical Connectors
For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations.
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