{"title":"用于同时监测移位指数分布参数的新 EWMA 图表","authors":"Amita Baranwal, Nirpeksh Kumar, Kashinath Chatterjee, Christos Koukouvinos","doi":"10.1080/02664763.2024.2363404","DOIUrl":null,"url":null,"abstract":"In various scenarios where products and services are accompanied by warranties to ensure their reliability over a specified time, the two-parameter (shifted) exponential distribution serves as a fu...","PeriodicalId":15239,"journal":{"name":"Journal of Applied Statistics","volume":"62 1","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new EWMA chart for simultaneously monitoring the parameters of a shifted exponential distribution\",\"authors\":\"Amita Baranwal, Nirpeksh Kumar, Kashinath Chatterjee, Christos Koukouvinos\",\"doi\":\"10.1080/02664763.2024.2363404\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In various scenarios where products and services are accompanied by warranties to ensure their reliability over a specified time, the two-parameter (shifted) exponential distribution serves as a fu...\",\"PeriodicalId\":15239,\"journal\":{\"name\":\"Journal of Applied Statistics\",\"volume\":\"62 1\",\"pages\":\"\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2024-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied Statistics\",\"FirstCategoryId\":\"100\",\"ListUrlMain\":\"https://doi.org/10.1080/02664763.2024.2363404\",\"RegionNum\":4,\"RegionCategory\":\"数学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"STATISTICS & PROBABILITY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Statistics","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/02664763.2024.2363404","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
A new EWMA chart for simultaneously monitoring the parameters of a shifted exponential distribution
In various scenarios where products and services are accompanied by warranties to ensure their reliability over a specified time, the two-parameter (shifted) exponential distribution serves as a fu...
期刊介绍:
Journal of Applied Statistics provides a forum for communication between both applied statisticians and users of applied statistical techniques across a wide range of disciplines. These areas include business, computing, economics, ecology, education, management, medicine, operational research and sociology, but papers from other areas are also considered. The editorial policy is to publish rigorous but clear and accessible papers on applied techniques. Purely theoretical papers are avoided but those on theoretical developments which clearly demonstrate significant applied potential are welcomed. Each paper is submitted to at least two independent referees.