M. Khin, S. Nopparatjamjomras, Ratchapak Chittaree, T. Nopparatjamjomras
{"title":"开发双极结型晶体管诊断测试(BJTDT),探索缅甸电子和泰国电气工程专业二年级本科生对双极结型晶体管工作原理和应用的了解程度","authors":"M. Khin, S. Nopparatjamjomras, Ratchapak Chittaree, T. Nopparatjamjomras","doi":"10.1080/22054952.2024.2347792","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38191,"journal":{"name":"Australasian Journal of Engineering Education","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of the Bipolar Junction Transistor Diagnostic Test (BJTDT) to explore the second-year undergraduate Myanmar electronic and Thai electrical engineering students’ understanding of BJT working principles and applications\",\"authors\":\"M. Khin, S. Nopparatjamjomras, Ratchapak Chittaree, T. Nopparatjamjomras\",\"doi\":\"10.1080/22054952.2024.2347792\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":38191,\"journal\":{\"name\":\"Australasian Journal of Engineering Education\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Australasian Journal of Engineering Education\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/22054952.2024.2347792\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"Social Sciences\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Australasian Journal of Engineering Education","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/22054952.2024.2347792","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Social Sciences","Score":null,"Total":0}
Development of the Bipolar Junction Transistor Diagnostic Test (BJTDT) to explore the second-year undergraduate Myanmar electronic and Thai electrical engineering students’ understanding of BJT working principles and applications