关于 LED 诊断和健康管理以及减少不确定性的调查

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Roberto Rocchetta , Elisa Perrone , Alexander Herzog , Pierre Dersin , Alessandro Di Bucchianico
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引用次数: 0

摘要

发光二极管(LED)的混合诊断与健康管理(PHM)框架通过将故障物理定律信息与数据驱动模型以及在线监测和数据收集工具相结合,寻求准确的剩余使用寿命(RUL)预测。不确定性量化(UQ)和减少不确定性对于实现准确预测和评估不同运行环境条件、数据缺乏和噪声对 LED 耐久性的影响至关重要。混合框架考虑了假定不确定性,并应用概率模型和预测来考虑 LED 寿命中固有的可变性和随机性。另一方面,混合框架往往忽视认识上的不确定性,缺乏正式的表征和还原方法。在本调查报告中,我们概述了 LED 的加速数据收集方法和建模选项。与其他作品不同的是,本综述侧重于不确定性量化以及混合 PHM 模型与优化实验设计方法的融合,以减少认识上的不确定性。特别是,结合统计优化标准和加速降解测试方案来优化数据收集,可以大大降低认识不确定性,提高混合预报模型的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A survey on LED Prognostics and Health Management and uncertainty reduction

Hybrid Prognostics and Health Management (PHM) frameworks for light-emitting diodes (LEDs) seek accurate remaining useful life (RUL) predictions by merging information from physics-of-failure laws with data-driven models and tools for online monitoring and data collection. Uncertainty quantification (UQ) and uncertainty reduction are essential to achieve accurate predictions and assess the effect of heterogeneous operational-environmental conditions, lack of data, and noises on LED durability. Aleatory uncertainty is considered in hybrid frameworks, and probabilistic models and predictions are applied to account for inherent variability and randomness in the LED lifetime. On the other hand, hybrid frameworks often neglect epistemic uncertainty, lacking formal characterization and reduction methods. In this survey, we propose an overview of accelerated data collection methods and modeling options for LEDs. In contrast to other works, this review focuses on uncertainty quantification and the fusion of hybrid PHM models with optimal design of experiment methods for epistemic uncertainty reduction. In particular, optimizing the data collection with a combination of statistical optimality criteria and accelerated degradation test schemes can substantially reduce the epistemic uncertainty and enhance the performance of hybrid prognostic models.

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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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