{"title":"电压控制磁各向异性 MRAM 的随机感知建模","authors":"Bowen Wang;Fernando García-Redondo;Marie Garcia Bardon;Hyungrock Oh;Mohit Gupta;Woojin Kim;Diego Favaro;Yukai Chen;Wim Dehaene","doi":"10.1109/TNANO.2024.3361718","DOIUrl":null,"url":null,"abstract":"This paper presents a physics-based compact model for Voltage-Controlled Magnetic Anisotropy (VCMA) MRAM, calibrated against fabricated devices. Our model addresses inherent stochasticity, offering a robust tool for the design and simulation of VCMA MRAM peripheral circuits. Achieving a tenfold increase in simulation speed compared to existing stochastic Landau-Lifshitz-Gilbert-Slonczewski (sLLGS) based models (\n<inline-formula><tex-math>$10\\times$</tex-math></inline-formula>\n to \n<inline-formula><tex-math>$100\\times$</tex-math></inline-formula>\n), and overcoming accuracy problems related to VCMA macro-spin sLLGS simulations, our approach enables efficient exploration of MRAM based circuits. The model efficiency and accuracy are demonstrated through a practical use case.","PeriodicalId":449,"journal":{"name":"IEEE Transactions on Nanotechnology","volume":"23 ","pages":"144-150"},"PeriodicalIF":2.1000,"publicationDate":"2024-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stochastic Aware Modeling of Voltage Controlled Magnetic Anisotropy MRAM\",\"authors\":\"Bowen Wang;Fernando García-Redondo;Marie Garcia Bardon;Hyungrock Oh;Mohit Gupta;Woojin Kim;Diego Favaro;Yukai Chen;Wim Dehaene\",\"doi\":\"10.1109/TNANO.2024.3361718\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a physics-based compact model for Voltage-Controlled Magnetic Anisotropy (VCMA) MRAM, calibrated against fabricated devices. Our model addresses inherent stochasticity, offering a robust tool for the design and simulation of VCMA MRAM peripheral circuits. Achieving a tenfold increase in simulation speed compared to existing stochastic Landau-Lifshitz-Gilbert-Slonczewski (sLLGS) based models (\\n<inline-formula><tex-math>$10\\\\times$</tex-math></inline-formula>\\n to \\n<inline-formula><tex-math>$100\\\\times$</tex-math></inline-formula>\\n), and overcoming accuracy problems related to VCMA macro-spin sLLGS simulations, our approach enables efficient exploration of MRAM based circuits. The model efficiency and accuracy are demonstrated through a practical use case.\",\"PeriodicalId\":449,\"journal\":{\"name\":\"IEEE Transactions on Nanotechnology\",\"volume\":\"23 \",\"pages\":\"144-150\"},\"PeriodicalIF\":2.1000,\"publicationDate\":\"2024-02-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Nanotechnology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10419071/\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10419071/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Stochastic Aware Modeling of Voltage Controlled Magnetic Anisotropy MRAM
This paper presents a physics-based compact model for Voltage-Controlled Magnetic Anisotropy (VCMA) MRAM, calibrated against fabricated devices. Our model addresses inherent stochasticity, offering a robust tool for the design and simulation of VCMA MRAM peripheral circuits. Achieving a tenfold increase in simulation speed compared to existing stochastic Landau-Lifshitz-Gilbert-Slonczewski (sLLGS) based models (
$10\times$
to
$100\times$
), and overcoming accuracy problems related to VCMA macro-spin sLLGS simulations, our approach enables efficient exploration of MRAM based circuits. The model efficiency and accuracy are demonstrated through a practical use case.
期刊介绍:
The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.