{"title":"具有低开关损耗和反向恢复损耗的新型 650 V 无回扣 PMOS-RC-SJBT","authors":"Yuanzhen Yang, Luping Li, Zehong Li, Qianshen Rao, Peng Chen, Min Ren","doi":"10.1088/1361-6641/ad112f","DOIUrl":null,"url":null,"abstract":"A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and <inline-formula>\n<tex-math><?CDATA $V_{\\mathrm{on}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>V</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">o</mml:mi><mml:mi mathvariant=\"normal\">n</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn1.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula>−<inline-formula>\n<tex-math><?CDATA $E_{\\mathrm{off}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">o</mml:mi><mml:mi mathvariant=\"normal\">f</mml:mi><mml:mi mathvariant=\"normal\">f</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn2.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (<inline-formula>\n<tex-math><?CDATA $E_{\\mathrm{rec}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">r</mml:mi><mml:mi mathvariant=\"normal\">e</mml:mi><mml:mi mathvariant=\"normal\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn3.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula>) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, <inline-formula>\n<tex-math><?CDATA $t_{\\mathrm{sc}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>t</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">s</mml:mi><mml:mi mathvariant=\"normal\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn4.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 <italic toggle=\"yes\">µ</italic>m of Con.RC-IGBT to 40 <italic toggle=\"yes\">µ</italic>m of PMOS-RC-SJBT, where the current uniformity is substantially improved.","PeriodicalId":21585,"journal":{"name":"Semiconductor Science and Technology","volume":"71 1","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2023-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel 650 V snapback-free PMOS-RC-SJBT with low switching and reverse recovery losses\",\"authors\":\"Yuanzhen Yang, Luping Li, Zehong Li, Qianshen Rao, Peng Chen, Min Ren\",\"doi\":\"10.1088/1361-6641/ad112f\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and <inline-formula>\\n<tex-math><?CDATA $V_{\\\\mathrm{on}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>V</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">o</mml:mi><mml:mi mathvariant=\\\"normal\\\">n</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn1.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula>−<inline-formula>\\n<tex-math><?CDATA $E_{\\\\mathrm{off}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">o</mml:mi><mml:mi mathvariant=\\\"normal\\\">f</mml:mi><mml:mi mathvariant=\\\"normal\\\">f</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn2.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (<inline-formula>\\n<tex-math><?CDATA $E_{\\\\mathrm{rec}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">r</mml:mi><mml:mi mathvariant=\\\"normal\\\">e</mml:mi><mml:mi mathvariant=\\\"normal\\\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn3.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula>) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, <inline-formula>\\n<tex-math><?CDATA $t_{\\\\mathrm{sc}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>t</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">s</mml:mi><mml:mi mathvariant=\\\"normal\\\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn4.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 <italic toggle=\\\"yes\\\">µ</italic>m of Con.RC-IGBT to 40 <italic toggle=\\\"yes\\\">µ</italic>m of PMOS-RC-SJBT, where the current uniformity is substantially improved.\",\"PeriodicalId\":21585,\"journal\":{\"name\":\"Semiconductor Science and Technology\",\"volume\":\"71 1\",\"pages\":\"\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Semiconductor Science and Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1361-6641/ad112f\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor Science and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1361-6641/ad112f","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A novel 650 V snapback-free PMOS-RC-SJBT with low switching and reverse recovery losses
A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and Von−Eoff trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (Erec) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, tsc is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 µm of Con.RC-IGBT to 40 µm of PMOS-RC-SJBT, where the current uniformity is substantially improved.
期刊介绍:
Devoted to semiconductor research, Semiconductor Science and Technology''s multidisciplinary approach reflects the far-reaching nature of this topic.
The scope of the journal covers fundamental and applied experimental and theoretical studies of the properties of non-organic, organic and oxide semiconductors, their interfaces and devices, including:
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materials and nanostructures
devices and applications
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new analytical techniques
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emerging fields:
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2D and topological materials
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