5G毫米波应用中PCB可靠性新问题研究

IF 0.7 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Xiao He, Lijuan Huang, Meizhen Xiao, Chengyong Yu, En Li, Weiheng Shao
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引用次数: 0

摘要

本文的目的是说明当传输频率从前几代的sub - 6ghz增加到第五代(5G)通信技术的毫米(mm)波时,对印刷电路板(PCB)设计、材料和工艺提出的新的技术要求和可靠性挑战。该方法包括理论分析和实际案例研究,采用各种表征技术,如立体显微镜、金相显微镜、扫描电子显微镜、能量色散光谱、聚焦离子束、高频结构模拟器、带状线谐振器和力学测试。结果为满足毫米波频段的PCB信号完整性要求,讨论了铜型材、树脂体系、增强织物、填料、电磁干扰设计、传输线以及通孔布置、表面处理、钻孔、涂布、层压和电镀等方面的改进建议。分析了不同频率或环境下复杂介电常数波动、剥离强度减弱、导电阳极丝、微孔裂纹、焊点空隙对信号传输性能的影响以及高速pcb球栅阵列位置的焊接异常等典型可靠性问题的失效原因和影响。原创性/价值PCB可靠性问题是导致PCB组件失效的主要因素,这是对送到我们实验室的失效案例进行统计得出的结论。PCB的可靠性水平对保证整个设备的可靠性至关重要。本文以全新的视角系统讨论了现有文献中很少报道的技术需求和可靠性问题,这对于识别5G毫米波应用中PCB的潜在可靠性风险并实施有针对性的改进至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation on the new reliability issues of PCB in 5G millimeter wave application
Purpose The purpose of this paper is to illustrate the new technical demands and reliability challenges to printed circuit board (PCB) designs, materials and processes when the transmission frequency increases from Sub-6 GHz in previous generations to millimeter (mm) wave in fifth-generation (5G) communication technology. Design/methodology/approach The approach involves theoretical analysis and actual case study by various characterization techniques, such as a stereo microscope, metallographic microscope, scanning electron microscope, energy dispersive spectroscopy, focused ion beam, high-frequency structure simulator, stripline resonator and mechanical test. Findings To meet PCB signal integrity demands in mm-wave frequency bands, the improving proposals on copper profile, resin system, reinforcement fabric, filler, electromagnetic interference-reducing design, transmission line as well as via layout, surface treatment, drilling, desmear, laminating and electroplating were discussed. And the failure causes and effects of typical reliability issues, including complex permittivity fluctuation at different frequencies or environments, weakening of peel strength, conductive anodic filament, crack on microvias, the effect of solder joint void on signal transmission performance and soldering anomalies at ball grid array location on high-speed PCBs, were demonstrated. Originality/value The PCB reliability problem is the leading factor to cause failures of PCB assemblies concluded from statistical results on the failure cases sent to our laboratory. The PCB reliability level is very essential to guarantee the reliability of the entire equipment. In this paper, the summarized technical demands and reliability issues that are rarely reported in existing articles were discussed systematically with new perspectives, which will be very critical to identify potential reliability risks for PCB in 5G mm-wave applications and implement targeted improvements.
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来源期刊
Microelectronics International
Microelectronics International 工程技术-材料科学:综合
CiteScore
1.90
自引率
9.10%
发文量
28
审稿时长
>12 weeks
期刊介绍: Microelectronics International provides an authoritative, international and independent forum for the critical evaluation and dissemination of research and development, applications, processes and current practices relating to advanced packaging, micro-circuit engineering, interconnection, semiconductor technology and systems engineering. It represents a current, comprehensive and practical information tool. The Editor, Dr John Atkinson, welcomes contributions to the journal including technical papers, research papers, case studies and review papers for publication. Please view the Author Guidelines for further details. Microelectronics International comprises a multi-disciplinary study of the key technologies and related issues associated with the design, manufacture, assembly and various applications of miniaturized electronic devices and advanced packages. Among the broad range of topics covered are: • Advanced packaging • Ceramics • Chip attachment • Chip on board (COB) • Chip scale packaging • Flexible substrates • MEMS • Micro-circuit technology • Microelectronic materials • Multichip modules (MCMs) • Organic/polymer electronics • Printed electronics • Semiconductor technology • Solid state sensors • Thermal management • Thick/thin film technology • Wafer scale processing.
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