使用标准数字ATE测量射频ZigBee收发器的EVM

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Pub Date : 2020-10-19 DOI:10.1109/DFT50435.2020.9250900

T. Vayssade, F. Azaïs, L. Latorre, F. Lefèvre

{"title":"使用标准数字ATE测量射频ZigBee收发器的EVM","authors":"T. Vayssade, F. Azaïs, L. Latorre, F. Lefèvre","doi":"10.1109/DFT50435.2020.9250900","DOIUrl":null,"url":null,"abstract":"This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.","PeriodicalId":340119,"journal":{"name":"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"EVM measurement of RF ZigBee transceivers using standard digital ATE\",\"authors\":\"T. Vayssade, F. Azaïs, L. Latorre, F. Lefèvre\",\"doi\":\"10.1109/DFT50435.2020.9250900\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.\",\"PeriodicalId\":340119,\"journal\":{\"name\":\"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"150 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT50435.2020.9250900\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT50435.2020.9250900","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

本文针对降低射频电路生产测试成本这一具有挑战性的问题进行了研究。更具体地说，它提出了一种低成本的解决方案，仅使用标准数字测试设备就可以对ZigBee收发器进行EVM测量。该方法基于射频调制信号的1位欠采样采集，通过数字测试通道与专门定制的处理算法相关联。文中详细介绍了后处理算法的各个步骤。给出了在模拟被测电路的通用软件无线电外设(USRP)和实际的ZigBee收发器IC上的硬件实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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EVM measurement of RF ZigBee transceivers using standard digital ATE

This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.

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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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