2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - 最新文献

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250888 G. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, I. Koren, Z. Koren

Reliability Evaluation of Pruned Neural Networks against Errors on Parameters

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250812 Zhen Gao, Xiaohui Wei, Han Zhang, Wenshuo Li, Guangjun Ge, Yu Wang, P. Reviriego

Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250797 Avijit Chakraborty, D. Walker

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