C. Liu, A. Menshov, V. Subramanian, K. Aygün, H. Braunisch, V. Okhmatovski, A. Yılmaz
{"title":"分层介质积分方程方法在全尺寸封装预测建模中的应用","authors":"C. Liu, A. Menshov, V. Subramanian, K. Aygün, H. Braunisch, V. Okhmatovski, A. Yılmaz","doi":"10.1109/EPEPS.2016.7835446","DOIUrl":null,"url":null,"abstract":"Layered-medium integral-equation (LMIE) methods that can confront the multiscale problems encountered in electromagnetic modeling of electronic packages are presented. The methods include (i) an impedance-boundary condition (IBC) formulation for modeling conductor thickness, roughness, and finite conductivity, (ii) non-radiating lumped-port models for extracting network parameters, and (iii) FFT based iterative and hierarchical-matrix (ℋ-matrix) based direct algorithms for efficiently solving the resulting systems of equations. The methods are used to analyze increasingly higher fidelity models of a benchmark packaging interconnect structure; the results are validated with measurements; and the tradeoff between increased model fidelity and computational costs are quantified.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"131 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Toward predictive modeling of full-size packages with layered-medium integral-equation methods\",\"authors\":\"C. Liu, A. Menshov, V. Subramanian, K. Aygün, H. Braunisch, V. Okhmatovski, A. Yılmaz\",\"doi\":\"10.1109/EPEPS.2016.7835446\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Layered-medium integral-equation (LMIE) methods that can confront the multiscale problems encountered in electromagnetic modeling of electronic packages are presented. The methods include (i) an impedance-boundary condition (IBC) formulation for modeling conductor thickness, roughness, and finite conductivity, (ii) non-radiating lumped-port models for extracting network parameters, and (iii) FFT based iterative and hierarchical-matrix (ℋ-matrix) based direct algorithms for efficiently solving the resulting systems of equations. The methods are used to analyze increasingly higher fidelity models of a benchmark packaging interconnect structure; the results are validated with measurements; and the tradeoff between increased model fidelity and computational costs are quantified.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"131 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835446\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Toward predictive modeling of full-size packages with layered-medium integral-equation methods
Layered-medium integral-equation (LMIE) methods that can confront the multiscale problems encountered in electromagnetic modeling of electronic packages are presented. The methods include (i) an impedance-boundary condition (IBC) formulation for modeling conductor thickness, roughness, and finite conductivity, (ii) non-radiating lumped-port models for extracting network parameters, and (iii) FFT based iterative and hierarchical-matrix (ℋ-matrix) based direct algorithms for efficiently solving the resulting systems of equations. The methods are used to analyze increasingly higher fidelity models of a benchmark packaging interconnect structure; the results are validated with measurements; and the tradeoff between increased model fidelity and computational costs are quantified.