{"title":"高分辨率印刷工艺,具有高吞吐量,增强步骤覆盖和高设计灵活性","authors":"Y. Kusaka, H. Ushijima","doi":"10.1109/ICEP.2016.7486794","DOIUrl":null,"url":null,"abstract":"Reverse offset printing and microcontact printing are fascinating methods for fabricating fine patterns because both of them can attain a 1-μm/1-μm line-and-space resolution, and the resulting patterns manifest uniform layer-thicknesses irrespective of the pattern sizes. However, the printed pattern has very sharp edges; therefore, the step-coverage of subsequent overlying layers has often been a severe problem. Further, as reverse offset printing and microcontact printing use an engraved glass and a stamp, respectively, the pattern design is restricted because of bottom-contact-type defects. Thermal sintering of the printed patterns also leads to a longer processing time. To address these problems, we have developed several complementary processes. In this presentation, wet-on-wet, electrode-embedding, and push-pull processes and a newly developed high-resolution planographic method called adhesion contrast planography are discussed.","PeriodicalId":343912,"journal":{"name":"2016 International Conference on Electronics Packaging (ICEP)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High resolution printing processes with high throughput, enhanced step coverage, and high design flexibility\",\"authors\":\"Y. Kusaka, H. Ushijima\",\"doi\":\"10.1109/ICEP.2016.7486794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reverse offset printing and microcontact printing are fascinating methods for fabricating fine patterns because both of them can attain a 1-μm/1-μm line-and-space resolution, and the resulting patterns manifest uniform layer-thicknesses irrespective of the pattern sizes. However, the printed pattern has very sharp edges; therefore, the step-coverage of subsequent overlying layers has often been a severe problem. Further, as reverse offset printing and microcontact printing use an engraved glass and a stamp, respectively, the pattern design is restricted because of bottom-contact-type defects. Thermal sintering of the printed patterns also leads to a longer processing time. To address these problems, we have developed several complementary processes. In this presentation, wet-on-wet, electrode-embedding, and push-pull processes and a newly developed high-resolution planographic method called adhesion contrast planography are discussed.\",\"PeriodicalId\":343912,\"journal\":{\"name\":\"2016 International Conference on Electronics Packaging (ICEP)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEP.2016.7486794\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEP.2016.7486794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High resolution printing processes with high throughput, enhanced step coverage, and high design flexibility
Reverse offset printing and microcontact printing are fascinating methods for fabricating fine patterns because both of them can attain a 1-μm/1-μm line-and-space resolution, and the resulting patterns manifest uniform layer-thicknesses irrespective of the pattern sizes. However, the printed pattern has very sharp edges; therefore, the step-coverage of subsequent overlying layers has often been a severe problem. Further, as reverse offset printing and microcontact printing use an engraved glass and a stamp, respectively, the pattern design is restricted because of bottom-contact-type defects. Thermal sintering of the printed patterns also leads to a longer processing time. To address these problems, we have developed several complementary processes. In this presentation, wet-on-wet, electrode-embedding, and push-pull processes and a newly developed high-resolution planographic method called adhesion contrast planography are discussed.