A. Serra, G. Bourgeois, M. Cyrille, J. Cluzel, J. Garrione, G. Navarro, E. Nowak
{"title":"相变材料高温导热系数3ω测量方法的优化","authors":"A. Serra, G. Bourgeois, M. Cyrille, J. Cluzel, J. Garrione, G. Navarro, E. Nowak","doi":"10.1109/ICMTS.2019.8730993","DOIUrl":null,"url":null,"abstract":"Thermal conductivity (kth) of Ge-rich Ge-Sb-Te phase-change material (GGST) is here investigated at temperatures up to $400\\ ^{\\circ}\\mathrm{C}$ through “3ω method”. We present the engineering of the test vehicle, with the optimization of the metal-based heater to achieve a reliable measurement even at high temperature. Finally, we compare the results from four different approaches, showing which method is more accurate for the kth evaluation in phase-change materials.","PeriodicalId":333915,"journal":{"name":"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimization of 3ω Method for Phase-Change Materials Thermal Conductivity Measurement at High Temperature\",\"authors\":\"A. Serra, G. Bourgeois, M. Cyrille, J. Cluzel, J. Garrione, G. Navarro, E. Nowak\",\"doi\":\"10.1109/ICMTS.2019.8730993\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermal conductivity (kth) of Ge-rich Ge-Sb-Te phase-change material (GGST) is here investigated at temperatures up to $400\\\\ ^{\\\\circ}\\\\mathrm{C}$ through “3ω method”. We present the engineering of the test vehicle, with the optimization of the metal-based heater to achieve a reliable measurement even at high temperature. Finally, we compare the results from four different approaches, showing which method is more accurate for the kth evaluation in phase-change materials.\",\"PeriodicalId\":333915,\"journal\":{\"name\":\"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2019.8730993\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2019.8730993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimization of 3ω Method for Phase-Change Materials Thermal Conductivity Measurement at High Temperature
Thermal conductivity (kth) of Ge-rich Ge-Sb-Te phase-change material (GGST) is here investigated at temperatures up to $400\ ^{\circ}\mathrm{C}$ through “3ω method”. We present the engineering of the test vehicle, with the optimization of the metal-based heater to achieve a reliable measurement even at high temperature. Finally, we compare the results from four different approaches, showing which method is more accurate for the kth evaluation in phase-change materials.