A. Douin, V. Pouget, D. Lewis, P. Fouillat, P. Perdu
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Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation
This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
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