T. Daenen, S. Thijs, M. Natarajan, V. Vassilev, V. De Heyn, G. Groeseneken
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A novel TLP testing approach, multilevel TLP (MTLP), is described, which can yield accurate and comprehensive snapback IV measurements unlike in the conventional TLP testing methodology with different system impedances. The experimental validity of the MTLP methodology and setup are demonstrated with measurement results from different snapback devices.
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