{"title":"基于延迟故障现实假设改进串扰时序无关测试","authors":"Shahdad Irajpour, S. Gupta, M. Breuer","doi":"10.1109/ATS.2007.86","DOIUrl":null,"url":null,"abstract":"Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults\",\"authors\":\"Shahdad Irajpour, S. Gupta, M. Breuer\",\"doi\":\"10.1109/ATS.2007.86\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"94 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.86\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.86","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults
Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.