金属间化合物焊点裂纹的断裂力学分析

M. O. Alam, H. Lu, C. Bailey, Y. Chan
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引用次数: 9

摘要

电子产品小型化的趋势导致需要非常小尺寸的焊点。因此,存在较高的可靠性风险,即焊点的太大一部分将在焊点界面转变为金属间化合物(IMCs)。本文采用有限元数值模拟方法对SnPb和无pb焊点IMC层的断裂力学进行了研究。假设在IMC层中只存在一个裂纹。采用线弹性断裂力学(LEFM)方法对焊料对接拉伸试样IMC层预定裂纹处的应力强度因子(SIF、KI和KII)进行了参数化研究。与直觉相反的是,更厚的IMC层实际上增加了裂纹IMC焊点的可靠性。在其他参数不变的情况下,KI和KII值随裂纹位置远离焊点界面而减小。焊料厚度和应变速率对SIF值也有显著影响。软钎料基体在靠近裂纹尖端的钎料- imc界面上产生不均匀的塑性变形,从而获得较高的KI和KII。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fracture mechanics analysis of cracks in solder joint Intermetallic Compounds
The trend towards miniaturization of electronic products leads to the need for very small sized solder joints. Therefore, there is a higher reliability risk that too large a fraction of solder joints will transform into Intermetallic Compounds (IMCs) at the solder interface. In this paper, fracture mechanics study of the IMC layer for SnPb and Pb-free solder joints was carried out using finite element numerical computer modelling method. It is assumed that only one crack is present in the IMC layer. Linear Elastic Fracture Mechanics (LEFM) approach is used for parametric study of the Stress Intensity Factors (SIF, KI and KII), at the predefined crack in the IMC layer of solder butt joint tensile sample. Contrary to intuition, it is revealed that a thicker IMC layer in fact increases the reliability of solder joint for a cracked IMC. Value of KI and KII are found to decrease with the location of the crack further away from the solder interfaces while other parameters are constant. Solder thickness and strain rate were also found to have a significant influence on the SIF values. It has been found that soft solder matrix generates non-uniform plastic deformation across the solder-IMC interface near the crack tip that is responsible to obtain higher KI and KII.
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