德州仪器VC33 DSP的加固

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI:10.1109/REDW.2010.5619513

R. Fuller, W. Morris, D. Gifford, R. Lowther, Jon Gwin, J. Salzman, D. Alexander, K. Hunt

{"title":"德州仪器VC33 DSP的加固","authors":"R. Fuller, W. Morris, D. Gifford, R. Lowther, Jon Gwin, J. Salzman, D. Alexander, K. Hunt","doi":"10.1109/REDW.2010.5619513","DOIUrl":null,"url":null,"abstract":"A hardened version of Texas Instruments'' VC33 Digital Signal Processor was created without any mask changes. The commercial mask set was processed using Silicon Space Technology''s HardSIL™ process variant to produce the hardened version. Radiation testing of the resulting hardened circuit demonstrated significant improvement in performance.","PeriodicalId":278033,"journal":{"name":"2010 IEEE Radiation Effects Data Workshop","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Hardening of Texas Instruments' VC33 DSP\",\"authors\":\"R. Fuller, W. Morris, D. Gifford, R. Lowther, Jon Gwin, J. Salzman, D. Alexander, K. Hunt\",\"doi\":\"10.1109/REDW.2010.5619513\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A hardened version of Texas Instruments'' VC33 Digital Signal Processor was created without any mask changes. The commercial mask set was processed using Silicon Space Technology''s HardSIL™ process variant to produce the hardened version. Radiation testing of the resulting hardened circuit demonstrated significant improvement in performance.\",\"PeriodicalId\":278033,\"journal\":{\"name\":\"2010 IEEE Radiation Effects Data Workshop\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Radiation Effects Data Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2010.5619513\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2010.5619513","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

德州仪器VC33数字信号处理器的强化版本在没有任何掩模改变的情况下创建。商用掩模组使用Silicon Space Technology的HardSIL™工艺变体来生产硬化版本。由此产生的硬化电路的辐射测试证明了性能的显著改善。

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Hardening of Texas Instruments' VC33 DSP

A hardened version of Texas Instruments'' VC33 Digital Signal Processor was created without any mask changes. The commercial mask set was processed using Silicon Space Technology''s HardSIL™ process variant to produce the hardened version. Radiation testing of the resulting hardened circuit demonstrated significant improvement in performance.

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2010 IEEE Radiation Effects Data Workshop

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