对SEE至关重要的航天器设备电子元件的整理

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891704

V. Anashin, A. Koziukov, P. Chubunov, K. Z. Faradian, S. Yakovlev, Aleksey V. Perebeynos, A. Vlasov, Alexey Borisov, Alexey A. Kryukov

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引用次数: 1

摘要

本文介绍了应用于卫星设备、对SEL和/或灾难性故障至关重要的COTS部件的SEE测试结果。它们被用来确认电子元件所需的硬度水平，并定义在锁存状态下如果在实验中观察到SEL的生存能力。在一些情况下，LET阈值是根据要求中指定的来确定的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Collation of the Electronic Components Intended to Spacecraft Eqiupment Critical to SEE

The paper presents SEE test results of COTS components considering to be applying in satellite equipment and critical to SEL and/or catastrophic failure. They were provided to confirm electronic components required hardness level and to define of the survivability in latched condition if SEL were observed during the experiment. In several cases LET thresholds were determined as it was specified in the requirements.

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2016 IEEE Radiation Effects Data Workshop (REDW)

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