Shuang Jiang, Shibin Liu, Chenguang Guo, Teng Ma, A. Paccagnella, Jialan Xie
{"title":"一种用于arinc659的抗辐射总线控制器芯片","authors":"Shuang Jiang, Shibin Liu, Chenguang Guo, Teng Ma, A. Paccagnella, Jialan Xie","doi":"10.1109/ICREED49760.2019.9205170","DOIUrl":null,"url":null,"abstract":"In this paper, a radiation-hardened bus controller chip for ARINC 659 is designed. To meet the needs of space radiation environment, most modules that may be affected by high-energy particles have been precisely hardened in terms of anti-SEU capability. Meanwhile, two kinds of TID-induced leakage are solved through layout design.","PeriodicalId":124372,"journal":{"name":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"51 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Radiation-hardened Bus Controller Chip for ARINC 659\",\"authors\":\"Shuang Jiang, Shibin Liu, Chenguang Guo, Teng Ma, A. Paccagnella, Jialan Xie\",\"doi\":\"10.1109/ICREED49760.2019.9205170\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a radiation-hardened bus controller chip for ARINC 659 is designed. To meet the needs of space radiation environment, most modules that may be affected by high-energy particles have been precisely hardened in terms of anti-SEU capability. Meanwhile, two kinds of TID-induced leakage are solved through layout design.\",\"PeriodicalId\":124372,\"journal\":{\"name\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"volume\":\"51 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICREED49760.2019.9205170\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICREED49760.2019.9205170","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Radiation-hardened Bus Controller Chip for ARINC 659
In this paper, a radiation-hardened bus controller chip for ARINC 659 is designed. To meet the needs of space radiation environment, most modules that may be affected by high-energy particles have been precisely hardened in terms of anti-SEU capability. Meanwhile, two kinds of TID-induced leakage are solved through layout design.