{"title":"试纸粘滞问题的改进历程","authors":"Euclea Cheah Wuan Ning","doi":"10.1109/IEMT.2012.6521816","DOIUrl":null,"url":null,"abstract":"Quite number of material was affected with sticky issue in an excursion which contributed to 0.10% yield drop. This excursion was caused by the presence of a strong bond between the UV tape and the device which made the device inseparable for tape and reel process. The study involves analysis of the root cause of the bonding layer as well as the measures taken to deal with the affected material and improvement actions done to qualify a new UV tape which does not have sticky issue. An alternate process was qualified to clear the affected material after thorough quality analysis was made. The yield and DPPM comparison of the UV tapes are taken into consideration to gauge the performance of the new UV tape while saving realized through qualification of the alternate process for sticky devices were discussed.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improvement journey of strip test sticky issue\",\"authors\":\"Euclea Cheah Wuan Ning\",\"doi\":\"10.1109/IEMT.2012.6521816\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quite number of material was affected with sticky issue in an excursion which contributed to 0.10% yield drop. This excursion was caused by the presence of a strong bond between the UV tape and the device which made the device inseparable for tape and reel process. The study involves analysis of the root cause of the bonding layer as well as the measures taken to deal with the affected material and improvement actions done to qualify a new UV tape which does not have sticky issue. An alternate process was qualified to clear the affected material after thorough quality analysis was made. The yield and DPPM comparison of the UV tapes are taken into consideration to gauge the performance of the new UV tape while saving realized through qualification of the alternate process for sticky devices were discussed.\",\"PeriodicalId\":315408,\"journal\":{\"name\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2012.6521816\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521816","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Quite number of material was affected with sticky issue in an excursion which contributed to 0.10% yield drop. This excursion was caused by the presence of a strong bond between the UV tape and the device which made the device inseparable for tape and reel process. The study involves analysis of the root cause of the bonding layer as well as the measures taken to deal with the affected material and improvement actions done to qualify a new UV tape which does not have sticky issue. An alternate process was qualified to clear the affected material after thorough quality analysis was made. The yield and DPPM comparison of the UV tapes are taken into consideration to gauge the performance of the new UV tape while saving realized through qualification of the alternate process for sticky devices were discussed.