{"title":"软件测试方法在硬件测试中的应用","authors":"R. Liyanage, E. W. Czeck","doi":"10.1109/ATW.1994.747833","DOIUrl":null,"url":null,"abstract":"This paper presents a behavioral-level test generation technique for VHDL models using data-domain and path extraction. To automate the data-domain method, algorithms for VHDL basic operations are developed. These algorithms are applied to several behavioral-VHDL specifications and an evaluation comparing test length and gate-level fault coverage is performed.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"59 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application Of Software Test Methods For Hardware Testing\",\"authors\":\"R. Liyanage, E. W. Czeck\",\"doi\":\"10.1109/ATW.1994.747833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a behavioral-level test generation technique for VHDL models using data-domain and path extraction. To automate the data-domain method, algorithms for VHDL basic operations are developed. These algorithms are applied to several behavioral-VHDL specifications and an evaluation comparing test length and gate-level fault coverage is performed.\",\"PeriodicalId\":217615,\"journal\":{\"name\":\"The Third Annual Atlantic Test Workshop\",\"volume\":\"59 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Third Annual Atlantic Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATW.1994.747833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application Of Software Test Methods For Hardware Testing
This paper presents a behavioral-level test generation technique for VHDL models using data-domain and path extraction. To automate the data-domain method, algorithms for VHDL basic operations are developed. These algorithms are applied to several behavioral-VHDL specifications and an evaluation comparing test length and gate-level fault coverage is performed.
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