{"title":"45nm SOI标准细胞库的时序验证","authors":"J. Pelloie, Y. Laplanche, C. Hawkins, Roma Kundu","doi":"10.1109/SOI.2010.5641402","DOIUrl":null,"url":null,"abstract":"A reliable timing verification methodology has been developed and proven on a 45nm SOI standard cell library. This methodology is currently used at more advanced process nodes.","PeriodicalId":227302,"journal":{"name":"2010 IEEE International SOI Conference (SOI)","volume":"105 7S 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Timing verification of a 45nm SOI standard cell library\",\"authors\":\"J. Pelloie, Y. Laplanche, C. Hawkins, Roma Kundu\",\"doi\":\"10.1109/SOI.2010.5641402\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A reliable timing verification methodology has been developed and proven on a 45nm SOI standard cell library. This methodology is currently used at more advanced process nodes.\",\"PeriodicalId\":227302,\"journal\":{\"name\":\"2010 IEEE International SOI Conference (SOI)\",\"volume\":\"105 7S 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International SOI Conference (SOI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOI.2010.5641402\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International SOI Conference (SOI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOI.2010.5641402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Timing verification of a 45nm SOI standard cell library
A reliable timing verification methodology has been developed and proven on a 45nm SOI standard cell library. This methodology is currently used at more advanced process nodes.
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