sic -石墨烯异质结紫外探测器

Hui Guo, Burui Liu, Beiju Huang, Hongda Chen
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引用次数: 2

摘要

在我们的研究中,我们报道了一种基于p掺杂石墨烯和n掺杂4H-SiC的sic -石墨烯异质结的紫外光电探测器。该器件结合了两种材料的优点,即由于P-N异质结的低暗电流和传统PIN UV光电探测器的响应率。该器件由正极、单层p掺杂石墨烯、N掺杂SiC层、N掺杂缓冲层、N+掺杂衬底和背电极组成,由上至下依次排列。首先,在掺N+的4H-SiC衬底上的2um掺N+缓冲层上生长了0.5um掺N的SiC外延层(Nd=1×1016cm−3)。利用镍掩膜和基于SF6/ o2的电感耦合等离子体(ICP)蚀刻技术,将SiC台面蚀刻至内部1um。然后采用高温退火法制备后欧姆接触电极。然后将单层p掺杂石墨烯转化到器件表面,并通过o2基反应离子蚀刻(RIE)蚀刻来蚀刻石墨烯台面。采用Ti/Au作为石墨烯区域的欧姆接触。器件制作完成后,在室温条件下,在0 ~ 6 V的反向偏置电压下测试了二极管的电流-电压特性。该器件的暗电流为10−14A ~ 10−12A。测量了不同波长光在1V反向偏置下的响应度。响应峰位于270nm波长附近,最大响应为0.032A/W。由于N−掺杂SiC层的掺杂浓度为1×1016cm−3,在1V反向偏置电压下,掺杂浓度过大而无法完全耗尽。这些数据并不能反映设备的最佳性能。然后我们在5v反向偏置照射下对器件进行测试,从270nm波长的紫外照射下,电流达到1 × 10−8A量级,这意味着响应度提高了一个数量级,超出了传统PIN紫外光电探测器的水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SiC-graphene heterojunction ultraviolet detector
In our study, we report a ultraviolet photodetector based on SiC-graphene heterojunction with P-doped graphene and N-doped 4H-SiC. The device combines the advantages of the two materials, both the low dark current owing to the P-N heterojunctions and the befitting magnitude of responsivity of the conventional PIN UV photodetectors are obtained. The device consists of positive electrode, single layer P-doped graphene, N-doped SiC layer, N-doped buffer layer, N+-doped substrate and back electrode, from top to bottom. Initially, a 0.5um N-doped SiC epitaxial layer was grown (Nd=1×1016cm−3) on a 2um N+-doped buffer layer on a N+-doped 4H-SiC substrate. SiC mesas were etched 1um into the interior with a litho-graphically patterned Ni mask and SF6/O2-based inductively coupled plasma (ICP) etch. Then the back ohmic contact electrode was formed with Ni by high temperature annealing. Single layer P-doped graphene was then transformed onto the devcice surface with the graphene mesa etched by O2-based reactive ion etching(RIE) etch. Ti/Au was used as the ohmic contact for graphene regions. After the device fabrication is finished, the diode current — voltage (I-V) characteristics were tested under reverse biased voltage from 0V to 6 V at room temperature. The dark current of the device is at the magnitude of 10−14A∼10−12A. The responsivity from the illumimation of different wavelengths of lights under reverse bias of 1V was measured. The responsivity peak lies near the 270nm wavelength, and the maximum response is 0.032A/W. Since the doping concentration of the N-doped SiC layer is 1×1016cm−3, it is too large to completely depleted under 1V reverse bias voltage. These data do not reflect the best performance of the device. We then test the device under 5 V reverse bias from the illumimation of 270nm wavelength UV irradiation, the current reached 1 × 10−8A magnitude, this means that the responsivity is raised by an order of magnitude, which beyond the level of traditional PIN ultraviolet photodetectors.
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