P. Bernardi, Lyl M. Ciganda Brasca, M. D. Carvalho, M. Grosso, Jorge Luis Lagos-Benites, E. Sánchez, M. Reorda, O. Ballan
{"title":"RISC处理器中地址计算单元的在线软件自测","authors":"P. Bernardi, Lyl M. Ciganda Brasca, M. D. Carvalho, M. Grosso, Jorge Luis Lagos-Benites, E. Sánchez, M. Reorda, O. Ballan","doi":"10.1109/ETS.2012.6233004","DOIUrl":null,"url":null,"abstract":"Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs with the mission application. This paper proposes a method for the generation of SBST programs to test on-line the Address Calculation Unit of embedded RISC processors, which is one of the most heavily impacted by the online constraints. The proposed strategy achieves high stuck-at fault coverage on both a MIPS-like processor and an industrial 32-bit pipelined processor; these two case studies show the effectiveness of the technique and the low effort.","PeriodicalId":429839,"journal":{"name":"2012 17th IEEE European Test Symposium (ETS)","volume":"241 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"On-line software-based self-test of the Address Calculation Unit in RISC processors\",\"authors\":\"P. Bernardi, Lyl M. Ciganda Brasca, M. D. Carvalho, M. Grosso, Jorge Luis Lagos-Benites, E. Sánchez, M. Reorda, O. Ballan\",\"doi\":\"10.1109/ETS.2012.6233004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs with the mission application. This paper proposes a method for the generation of SBST programs to test on-line the Address Calculation Unit of embedded RISC processors, which is one of the most heavily impacted by the online constraints. The proposed strategy achieves high stuck-at fault coverage on both a MIPS-like processor and an industrial 32-bit pipelined processor; these two case studies show the effectiveness of the technique and the low effort.\",\"PeriodicalId\":429839,\"journal\":{\"name\":\"2012 17th IEEE European Test Symposium (ETS)\",\"volume\":\"241 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 17th IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2012.6233004\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 17th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2012.6233004","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-line software-based self-test of the Address Calculation Unit in RISC processors
Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs with the mission application. This paper proposes a method for the generation of SBST programs to test on-line the Address Calculation Unit of embedded RISC processors, which is one of the most heavily impacted by the online constraints. The proposed strategy achieves high stuck-at fault coverage on both a MIPS-like processor and an industrial 32-bit pipelined processor; these two case studies show the effectiveness of the technique and the low effort.