{"title":"千兆DRAM趋势","authors":"T. Furuyama","doi":"10.1109/MTDT.1996.782490","DOIUrl":null,"url":null,"abstract":"DRAM’s have been achieving higher and higher memory capacity by reducing the device sizes and complicating the memory cell structures. At present, 64M’s are available in the market and 1 GIs are under development in many semiconductor companies. Some early 1 G chips were presented at the ISSCC (International Solid State Circuits Conference) last year for the first time. DRAM’s have been also getting faster and faster as the generation has proceeded by taking an advantage of device miniaturization as well as adopting new circuit designs, such as Synchronous DRAM and Rambus technologies. Many questions have been recently raised, however, including the limit of existing memory cell technologies, how to improve speed to catch up the processor operation without blowing up the power consumption, how to realize a system that does not require as large amount of memory as the most advanced DRAM’s can provide by a single chip but requires very high data rate and performance, and so on. Test time/cost reduction is also an issue. In this presentation, I will review the state of the art DRAM technologies, functions, and circuit design topics. Trench and stacked cell technologies for 1 G DRAM’s will be compared. Different DRAM functions will be reviewed and their performances will be compared. I would also like to explore some of the issues and questions and to review some ideas recently published intending to solve these issues. The DRAM and Logic merged technology, which is presently a very hot topic in the industry and getting more and more popular, will be discussed as a candidate to provide fairly small amount of memory but high performance. Future DRAM trends from technology, function, application and other points of view, will be briefly summarized.","PeriodicalId":228146,"journal":{"name":"IEEE International Workshop on Memory Technology, Design and Testing,","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Giga-bit DRAM trend\",\"authors\":\"T. Furuyama\",\"doi\":\"10.1109/MTDT.1996.782490\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DRAM’s have been achieving higher and higher memory capacity by reducing the device sizes and complicating the memory cell structures. At present, 64M’s are available in the market and 1 GIs are under development in many semiconductor companies. Some early 1 G chips were presented at the ISSCC (International Solid State Circuits Conference) last year for the first time. DRAM’s have been also getting faster and faster as the generation has proceeded by taking an advantage of device miniaturization as well as adopting new circuit designs, such as Synchronous DRAM and Rambus technologies. Many questions have been recently raised, however, including the limit of existing memory cell technologies, how to improve speed to catch up the processor operation without blowing up the power consumption, how to realize a system that does not require as large amount of memory as the most advanced DRAM’s can provide by a single chip but requires very high data rate and performance, and so on. Test time/cost reduction is also an issue. In this presentation, I will review the state of the art DRAM technologies, functions, and circuit design topics. Trench and stacked cell technologies for 1 G DRAM’s will be compared. Different DRAM functions will be reviewed and their performances will be compared. I would also like to explore some of the issues and questions and to review some ideas recently published intending to solve these issues. The DRAM and Logic merged technology, which is presently a very hot topic in the industry and getting more and more popular, will be discussed as a candidate to provide fairly small amount of memory but high performance. Future DRAM trends from technology, function, application and other points of view, will be briefly summarized.\",\"PeriodicalId\":228146,\"journal\":{\"name\":\"IEEE International Workshop on Memory Technology, Design and Testing,\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Workshop on Memory Technology, Design and Testing,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.1996.782490\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Workshop on Memory Technology, Design and Testing,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1996.782490","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
DRAM’s have been achieving higher and higher memory capacity by reducing the device sizes and complicating the memory cell structures. At present, 64M’s are available in the market and 1 GIs are under development in many semiconductor companies. Some early 1 G chips were presented at the ISSCC (International Solid State Circuits Conference) last year for the first time. DRAM’s have been also getting faster and faster as the generation has proceeded by taking an advantage of device miniaturization as well as adopting new circuit designs, such as Synchronous DRAM and Rambus technologies. Many questions have been recently raised, however, including the limit of existing memory cell technologies, how to improve speed to catch up the processor operation without blowing up the power consumption, how to realize a system that does not require as large amount of memory as the most advanced DRAM’s can provide by a single chip but requires very high data rate and performance, and so on. Test time/cost reduction is also an issue. In this presentation, I will review the state of the art DRAM technologies, functions, and circuit design topics. Trench and stacked cell technologies for 1 G DRAM’s will be compared. Different DRAM functions will be reviewed and their performances will be compared. I would also like to explore some of the issues and questions and to review some ideas recently published intending to solve these issues. The DRAM and Logic merged technology, which is presently a very hot topic in the industry and getting more and more popular, will be discussed as a candidate to provide fairly small amount of memory but high performance. Future DRAM trends from technology, function, application and other points of view, will be briefly summarized.