gpgpu的ECC效率和功效

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Pub Date : 2014-11-24 DOI:10.1109/DFT.2014.6962085

Daniel Oliveira, P. Rech, L. Pilla, P. Navaux, L. Carro

{"title":"gpgpu的ECC效率和功效","authors":"Daniel Oliveira, P. Rech, L. Pilla, P. Navaux, L. Carro","doi":"10.1109/DFT.2014.6962085","DOIUrl":null,"url":null,"abstract":"In this paper we assess and discuss the efficiency and overhead of the Error-Correcting Code (ECC) mechanism available on modern GPGPUs, which are increasingly used for both High Performance Computing and safety-critical applications. Both the resilience to radiation-induced silent data corruption and functional interruption are experimentally and analytically addressed. The provided experimental analysis demonstrates that the ECC significantly reduces the occurrence of silent data corruption but may not be sufficient to guarantee high reliability. Moreover, the ECC increases the GPGPU functional interruption rate. Finally, the ECC performances and reliability are compared to Algorithm-Based Fault Tolerance and Duplication With Comparison strategies.","PeriodicalId":414665,"journal":{"name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"GPGPUs ECC efficiency and efficacy\",\"authors\":\"Daniel Oliveira, P. Rech, L. Pilla, P. Navaux, L. Carro\",\"doi\":\"10.1109/DFT.2014.6962085\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we assess and discuss the efficiency and overhead of the Error-Correcting Code (ECC) mechanism available on modern GPGPUs, which are increasingly used for both High Performance Computing and safety-critical applications. Both the resilience to radiation-induced silent data corruption and functional interruption are experimentally and analytically addressed. The provided experimental analysis demonstrates that the ECC significantly reduces the occurrence of silent data corruption but may not be sufficient to guarantee high reliability. Moreover, the ECC increases the GPGPU functional interruption rate. Finally, the ECC performances and reliability are compared to Algorithm-Based Fault Tolerance and Duplication With Comparison strategies.\",\"PeriodicalId\":414665,\"journal\":{\"name\":\"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2014.6962085\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2014.6962085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 18

摘要

在本文中，我们评估和讨论了现代gpgpu上可用的纠错码(ECC)机制的效率和开销，这些机制越来越多地用于高性能计算和安全关键应用。对辐射引起的数据静默损坏和功能中断的弹性进行了实验和分析。所提供的实验分析表明，ECC显着减少了无声数据损坏的发生，但可能不足以保证高可靠性。同时，ECC提高了GPGPU的功能中断率。最后，将ECC的性能和可靠性与基于算法的容错和复制比较策略进行了比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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GPGPUs ECC efficiency and efficacy

In this paper we assess and discuss the efficiency and overhead of the Error-Correcting Code (ECC) mechanism available on modern GPGPUs, which are increasingly used for both High Performance Computing and safety-critical applications. Both the resilience to radiation-induced silent data corruption and functional interruption are experimentally and analytically addressed. The provided experimental analysis demonstrates that the ECC significantly reduces the occurrence of silent data corruption but may not be sufficient to guarantee high reliability. Moreover, the ECC increases the GPGPU functional interruption rate. Finally, the ECC performances and reliability are compared to Algorithm-Based Fault Tolerance and Duplication With Comparison strategies.

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2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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