{"title":"坡莫合金薄膜和坡莫合金/Cu多层膜的磁阻特性","authors":"J. Neamtu, M. Volmer, A. Coraci","doi":"10.1109/SMICND.1998.732348","DOIUrl":null,"url":null,"abstract":"The results on the magnetic properties, such as anisotropic magnetoresistance (AMR) of NiFe (permalloy) thin films and giant magnetoresistance (GMR) of (NiFe/Cu/NiFe) multilayers have been investigated. The correlation of the magnetoresistance effects with microstructure and deposition parameters of magnetic thin films and multilayers is presented.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Magnetoresistive properties of permalloy thin films and permalloy/Cu multilayers\",\"authors\":\"J. Neamtu, M. Volmer, A. Coraci\",\"doi\":\"10.1109/SMICND.1998.732348\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The results on the magnetic properties, such as anisotropic magnetoresistance (AMR) of NiFe (permalloy) thin films and giant magnetoresistance (GMR) of (NiFe/Cu/NiFe) multilayers have been investigated. The correlation of the magnetoresistance effects with microstructure and deposition parameters of magnetic thin films and multilayers is presented.\",\"PeriodicalId\":406922,\"journal\":{\"name\":\"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-10-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.1998.732348\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.732348","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Magnetoresistive properties of permalloy thin films and permalloy/Cu multilayers
The results on the magnetic properties, such as anisotropic magnetoresistance (AMR) of NiFe (permalloy) thin films and giant magnetoresistance (GMR) of (NiFe/Cu/NiFe) multilayers have been investigated. The correlation of the magnetoresistance effects with microstructure and deposition parameters of magnetic thin films and multilayers is presented.