弱电阻桥的测试生成

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.75

Shahdad Irajpour, S. Gupta, M. Breuer

{"title":"弱电阻桥的测试生成","authors":"Shahdad Irajpour, S. Gupta, M. Breuer","doi":"10.1109/ATS.2006.75","DOIUrl":null,"url":null,"abstract":"An approach for testing weak resistive bridge targets is developed. The approach is based on defining and generating tests for a set of surrogates associated with each target. Either no or limited timing information is used during test generation. Experimental results show much higher coverage of targets and much lower complexity compared to those for crosstalk targets","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"12 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Test Generation for Weak Resistive Bridges\",\"authors\":\"Shahdad Irajpour, S. Gupta, M. Breuer\",\"doi\":\"10.1109/ATS.2006.75\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approach for testing weak resistive bridge targets is developed. The approach is based on defining and generating tests for a set of surrogates associated with each target. Either no or limited timing information is used during test generation. Experimental results show much higher coverage of targets and much lower complexity compared to those for crosstalk targets\",\"PeriodicalId\":242530,\"journal\":{\"name\":\"2006 15th Asian Test Symposium\",\"volume\":\"12 2\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 15th Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2006.75\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.75","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

提出了一种测试弱电阻桥靶的方法。该方法基于为与每个目标关联的一组代理定义和生成测试。在测试生成期间，要么不使用定时信息，要么使用有限的定时信息。实验结果表明，与串扰目标相比，该方法具有更高的目标覆盖率和更低的复杂度

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Test Generation for Weak Resistive Bridges

An approach for testing weak resistive bridge targets is developed. The approach is based on defining and generating tests for a set of surrogates associated with each target. Either no or limited timing information is used during test generation. Experimental results show much higher coverage of targets and much lower complexity compared to those for crosstalk targets

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2006 15th Asian Test Symposium

自引率

0.00%

发文量