嵌入式系统中的CPU可测试性

2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications Pub Date : 2010-01-13 DOI:10.1109/DELTA.2010.33

J. Sosnowski, Lukasz Tupaj

{"title":"嵌入式系统中的CPU可测试性","authors":"J. Sosnowski, Lukasz Tupaj","doi":"10.1109/DELTA.2010.33","DOIUrl":null,"url":null,"abstract":"The paper deals with the problem of testing CPUs in embedded systems taking into account application properties. Basing on the developed original software tools we have analysed the coverage of CPU functionality and operational stresses for many benchmark programs. The experimental results confirmed the need of introducing application driven testing of CPUs to assure high fault coverage with acceptable software and time overheads. This original approach has been used in some real systems.","PeriodicalId":421336,"journal":{"name":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"CPU Testability in Embedded Systems\",\"authors\":\"J. Sosnowski, Lukasz Tupaj\",\"doi\":\"10.1109/DELTA.2010.33\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with the problem of testing CPUs in embedded systems taking into account application properties. Basing on the developed original software tools we have analysed the coverage of CPU functionality and operational stresses for many benchmark programs. The experimental results confirmed the need of introducing application driven testing of CPUs to assure high fault coverage with acceptable software and time overheads. This original approach has been used in some real systems.\",\"PeriodicalId\":421336,\"journal\":{\"name\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"volume\":\"70 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-01-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2010.33\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2010.33","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

本文从应用特性出发，研究了嵌入式系统中cpu的测试问题。基于开发的原始软件工具，我们分析了许多基准测试程序的CPU功能覆盖范围和操作压力。实验结果证实了引入应用程序驱动的cpu测试的必要性，以确保高故障覆盖率和可接受的软件和时间开销。这种原始方法已经在一些实际系统中得到了应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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CPU Testability in Embedded Systems

The paper deals with the problem of testing CPUs in embedded systems taking into account application properties. Basing on the developed original software tools we have analysed the coverage of CPU functionality and operational stresses for many benchmark programs. The experimental results confirmed the need of introducing application driven testing of CPUs to assure high fault coverage with acceptable software and time overheads. This original approach has been used in some real systems.

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2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications

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