{"title":"相位噪声的数字测量方法","authors":"A. Ecker, Kenneth Blakkan, M. Soma","doi":"10.1109/TEST.2012.6401537","DOIUrl":null,"url":null,"abstract":"To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.","PeriodicalId":353290,"journal":{"name":"2012 IEEE International Test Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"A digital method for phase noise measurement\",\"authors\":\"A. Ecker, Kenneth Blakkan, M. Soma\",\"doi\":\"10.1109/TEST.2012.6401537\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.\",\"PeriodicalId\":353290,\"journal\":{\"name\":\"2012 IEEE International Test Conference\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2012.6401537\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2012.6401537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.
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