{"title":"流水线组合电路中延迟缺陷容忍度的分析与改进","authors":"D. Wessels, J. Muzio","doi":"10.1109/DFTVS.1995.476951","DOIUrl":null,"url":null,"abstract":"In this paper, we consider the problems of identification of delay-fault-sensitive components in a pipelined combinational circuit, and of circuit modification to improve the circuit's tolerance of delay faults. The results assume purely combinational logic, and fixed gate delays calculated under floating delay mode.","PeriodicalId":362167,"journal":{"name":"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Analyzing and improving delay defect tolerance in pipelined combinational circuits\",\"authors\":\"D. Wessels, J. Muzio\",\"doi\":\"10.1109/DFTVS.1995.476951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we consider the problems of identification of delay-fault-sensitive components in a pipelined combinational circuit, and of circuit modification to improve the circuit's tolerance of delay faults. The results assume purely combinational logic, and fixed gate delays calculated under floating delay mode.\",\"PeriodicalId\":362167,\"journal\":{\"name\":\"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1995.476951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1995.476951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analyzing and improving delay defect tolerance in pipelined combinational circuits
In this paper, we consider the problems of identification of delay-fault-sensitive components in a pipelined combinational circuit, and of circuit modification to improve the circuit's tolerance of delay faults. The results assume purely combinational logic, and fixed gate delays calculated under floating delay mode.