K. Hagiwara, M. Goto, H. Ohtake, Y. Iguchi, T. Saraya, H. Toshiyoshi, E. Higurashi, T. Hiramoto
{"title":"用于三维集成图像传感器的Au/SiO2混合键合基板的机械磨削","authors":"K. Hagiwara, M. Goto, H. Ohtake, Y. Iguchi, T. Saraya, H. Toshiyoshi, E. Higurashi, T. Hiramoto","doi":"10.1109/LTB-3D.2014.6886150","DOIUrl":null,"url":null,"abstract":"Mechanical grinding is utilized to thin the backside Si layer of Au/SiO2 hybrid-bonded substrates. Due to the high bond strength after the surface activation treatment, the Si layer thickness could be reduced to 35 μm without chipping. The proposed approach is highly promising for the fabrication of three-dimensional integrated image sensors.","PeriodicalId":123514,"journal":{"name":"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Mechanical grinding of Au/SiO2 hybrid-bonded substrates for 3D integrated image sensors\",\"authors\":\"K. Hagiwara, M. Goto, H. Ohtake, Y. Iguchi, T. Saraya, H. Toshiyoshi, E. Higurashi, T. Hiramoto\",\"doi\":\"10.1109/LTB-3D.2014.6886150\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mechanical grinding is utilized to thin the backside Si layer of Au/SiO2 hybrid-bonded substrates. Due to the high bond strength after the surface activation treatment, the Si layer thickness could be reduced to 35 μm without chipping. The proposed approach is highly promising for the fabrication of three-dimensional integrated image sensors.\",\"PeriodicalId\":123514,\"journal\":{\"name\":\"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LTB-3D.2014.6886150\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LTB-3D.2014.6886150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mechanical grinding of Au/SiO2 hybrid-bonded substrates for 3D integrated image sensors
Mechanical grinding is utilized to thin the backside Si layer of Au/SiO2 hybrid-bonded substrates. Due to the high bond strength after the surface activation treatment, the Si layer thickness could be reduced to 35 μm without chipping. The proposed approach is highly promising for the fabrication of three-dimensional integrated image sensors.