{"title":"用于每单元2位存储的逻辑/电阻开关混合晶体管","authors":"Shih-Chieh Wu, Chieh-Ting Lo, T. Hou","doi":"10.1109/VLSI-TSA.2012.6210103","DOIUrl":null,"url":null,"abstract":"Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the VD-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible VTH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.","PeriodicalId":388574,"journal":{"name":"Proceedings of Technical Program of 2012 VLSI Technology, System and Application","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Logic/resistive-switching hybrid transistor for two-bit-per-cell storage\",\"authors\":\"Shih-Chieh Wu, Chieh-Ting Lo, T. Hou\",\"doi\":\"10.1109/VLSI-TSA.2012.6210103\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the VD-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible VTH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.\",\"PeriodicalId\":388574,\"journal\":{\"name\":\"Proceedings of Technical Program of 2012 VLSI Technology, System and Application\",\"volume\":\"72 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Technical Program of 2012 VLSI Technology, System and Application\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI-TSA.2012.6210103\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Technical Program of 2012 VLSI Technology, System and Application","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-TSA.2012.6210103","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Logic/resistive-switching hybrid transistor for two-bit-per-cell storage
Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the VD-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible VTH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.