Behavioral test generation using mixed integer nonlinear programming

This paper describes a novel technique to generate test vectors for single stuck-at faults using the behavioral description of the circuit function and the mapping from the behavior into the hardware that implements it. The test vector generation problem is formulated as a mixed integer nonlinear programming (MINLP) problem, and the test vectors are obtained by solving a series of MINLPs. The technique has been implemented and results from this approach show an order of magnitude speed up in test generation compared to existing gate-level sequential test generation tools.