{"title":"3DIC电路设计和建模的特殊考虑","authors":"Sally Liu, Y. Peng, F. Hsueh","doi":"10.1109/ICICDT.2011.5783200","DOIUrl":null,"url":null,"abstract":"In this paper, the new elements in 3DIC are examined for enabling optimal 3D products: including 3D interconnect which maybe the limiting factor to achievable speed; 3D chip design strategy (partition and implementation) to achive optimal performance; wireless testing to address the challenges in testing a partial system / chip before stacking and with limited observation points after stacking.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Special considerations for 3DIC circuit design and modeling\",\"authors\":\"Sally Liu, Y. Peng, F. Hsueh\",\"doi\":\"10.1109/ICICDT.2011.5783200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the new elements in 3DIC are examined for enabling optimal 3D products: including 3D interconnect which maybe the limiting factor to achievable speed; 3D chip design strategy (partition and implementation) to achive optimal performance; wireless testing to address the challenges in testing a partial system / chip before stacking and with limited observation points after stacking.\",\"PeriodicalId\":402000,\"journal\":{\"name\":\"2011 IEEE International Conference on IC Design & Technology\",\"volume\":\"123 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Conference on IC Design & Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2011.5783200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Special considerations for 3DIC circuit design and modeling
In this paper, the new elements in 3DIC are examined for enabling optimal 3D products: including 3D interconnect which maybe the limiting factor to achievable speed; 3D chip design strategy (partition and implementation) to achive optimal performance; wireless testing to address the challenges in testing a partial system / chip before stacking and with limited observation points after stacking.