3DIC电路设计和建模的特殊考虑

Sally Liu, Y. Peng, F. Hsueh
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引用次数: 8

摘要

在本文中,为了实现最佳的3D产品,研究了3DIC中的新元素:包括3D互连,这可能是实现速度的限制因素;实现最优性能的三维芯片设计策略(分区与实现);无线测试解决了在堆叠前测试部分系统/芯片以及堆叠后有限观察点的挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Special considerations for 3DIC circuit design and modeling
In this paper, the new elements in 3DIC are examined for enabling optimal 3D products: including 3D interconnect which maybe the limiting factor to achievable speed; 3D chip design strategy (partition and implementation) to achive optimal performance; wireless testing to address the challenges in testing a partial system / chip before stacking and with limited observation points after stacking.
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